2022
DOI: 10.1016/j.apsusc.2022.153882
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The photoemission characteristics of a NEA InGaN photocathode by simultaneously supplying Cs and O2

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Cited by 9 publications
(4 citation statements)
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“…The absorption coefficient of the emission layer can be derived from Figure 4 a. The reflectivity of the photocathode (R) is calculated by using optical film matrix theory, which reports a consistent trend in InGaAs-based devices, and hence the reflectivity value is fixed at 0.3 as well [ 27 ]. In order to study the time response of the In 0.15 Ga 0.85 As photocathode in the NIR region, the incident light is selected as a Gauss pulse with a wavelength of 1064 nm, and all photoelectron densities emitted by the In 0.15 Ga 0.85 As photocathode were normalized to the incident signal.…”
Section: Resultsmentioning
confidence: 99%
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“…The absorption coefficient of the emission layer can be derived from Figure 4 a. The reflectivity of the photocathode (R) is calculated by using optical film matrix theory, which reports a consistent trend in InGaAs-based devices, and hence the reflectivity value is fixed at 0.3 as well [ 27 ]. In order to study the time response of the In 0.15 Ga 0.85 As photocathode in the NIR region, the incident light is selected as a Gauss pulse with a wavelength of 1064 nm, and all photoelectron densities emitted by the In 0.15 Ga 0.85 As photocathode were normalized to the incident signal.…”
Section: Resultsmentioning
confidence: 99%
“…Hence, we also analyzed the impact factors of the quantum efficiency, including D n , S v , and T e . Related to the properties of the material, the thickness of the buffer layer was set as 0.2 μm [ 23 ] and the electron diffusion length was 1.7 μm [ 27 ]. By fixing S v at 10 4 cm/s and T e at 1.8 um, the quantum efficiency curves of the proposed structure with different electron diffusion coefficients of In 0.15 Ga 0.85 As are simulated for optimal performance of the photocathode, as given in Figure 6 a.…”
Section: Resultsmentioning
confidence: 99%
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“…The possibility of multiple adsorption forms of Cs and O 2 has also been reported experimentally for InGaN, a nitride semiconductor. 33) The number of adsorbed components and the θ 0 increase on the Al 0.5 Ga 0.5 N surface codeposited with Cs/O 2 compared to Cs. The increase in thermionic emission current due to the alternating Cs/O 2 supply shown in Fig.…”
Section: Mrm Fitting Of Thermionic Emission Current Frommentioning
confidence: 98%