The out-of-plane correlation length of the conformal roughness in Co–Pd multilayers

Pym, A. T. G.; Rozatian, A. S. H.; Marrows, C. H.; Hickey, B. J.; Hase, Thomas P. A.; Tanner, B. K.

doi:10.1016/j.physb.2004.11.050

Cited by 2 publications

(1 citation statement)

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“…Interference fringes in the ridge of diffuse scatter at q y = 0 were observed only up to about N = 12 (figure 3), indicating that the out-of-plane correlation length is several hundred angstroms. This is consistent with the measurement of the width of the Bragg sheet in the q z direction and fitting of transverse diffuse scans to the self-affine fractal model [5]. In the case of N = 20, shown in figure 4, no such Kiessig fringes can be observed, indicating that the roughness at the top of the multilayer stack is no longer conformal with that at the bottom by this number of repeats.…”

Section: Resultssupporting

confidence: 87%

The in-plane length scale of the conformal interface roughness as a function of bilayer repeat number in Co/Pd multilayers

Pym¹,

Rozatian²,

Marrows³

et al. 2005

J. Phys. D: Appl. Phys.

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Grazing incidence small angle x-ray scattering has been used to probe the in-plane length scale and scaling behaviour of the conformal interface roughness of sputtered Co/Pd multilayers. Scaling was seen in the intensity distribution through the Bragg sheets for large out-of-plane wavevectors. The scaling exponent showed power law variation with multilayer repeat number, the extreme values being close to those predicted by the Kardar–Parisi–Zhang and Tang–Alexander–Bruinsma models of film growth. The wavevector at which scaling broke down increased linearly with repeat number. A power law increase as a function of bilayer repeat number was found in the in-plane correlation length defined by fitting the scattering in the incidence plane to the Sinha model. Both approaches showed that the multilayer interfaces tended towards a two-dimensional character as the number of repeats increased.

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Section: Resultssupporting

confidence: 87%