2007
DOI: 10.1016/j.susc.2007.04.225
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The origin of spectral distortion in electric field modulation spectroscopy based on scanning tunneling microscopy

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Cited by 9 publications
(9 citation statements)
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“…[12][13][14][15][16] The origin of the lowenergy band, a magnified image of which is shown in the inset, can be attributed to photoabsorption by the GaSb dots. The former threshold corresponds to the indirect photoabsorption edge of the Si substrate, as reported elsewhere.…”
Section: Resultsmentioning
confidence: 99%
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“…[12][13][14][15][16] The origin of the lowenergy band, a magnified image of which is shown in the inset, can be attributed to photoabsorption by the GaSb dots. The former threshold corresponds to the indirect photoabsorption edge of the Si substrate, as reported elsewhere.…”
Section: Resultsmentioning
confidence: 99%
“…9,10,13,15 Measurements under tunneling conditions can cause signal fluctuations as a result of thermal drift, and Figure 2(d) shows the STM-EFMS spectra obtained from the same dots as those in Figs. 9,10,13,15 Measurements under tunneling conditions can cause signal fluctuations as a result of thermal drift, and Figure 2(d) shows the STM-EFMS spectra obtained from the same dots as those in Figs.…”
Section: Resultsmentioning
confidence: 99%
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“…The details of the STM-EFMS measurements are described in previous papers. 16,22 Iron silicides were formed by codeposition of 4-ML Fe and 8-ML Si at various temperatures, T co of RT-500 °C, after 1-ML Si was deposited on ∼0.3 nm ultrathin SiO 2 films at ∼670 °C (Si predeposition). Figure 1a,b show RHEED patterns of the iron silicides formed by codeposition at 500 °C and RT, respectively.…”
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confidence: 99%