Abstract:This paper proposes a math-physical correlative method that monitors deep defect response by electrical measurement and calculates the state density by designed mathematical processing. The extracted Gaussian distribution of deep defects was discussed according to the theoretical model for the density of states. The accuracy of this method was also verified through 1/f low frequency noise analysis. The origination of deep defects was investigated by transmission electron microscope, x-ray photoelectron spectro… Show more
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