1996
DOI: 10.1107/s0108767396000773
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The Non-Resonant Magnetic X-ray Scattering Cross Section of MnF2. 2. High-Energy X-ray Diffraction at 80keV

Abstract: Results of high-energy non-resonant magnetic X-ray diffraction experiments performed on the model system MnF 2 at a photon energy of 80 keV are presented. A surprisingly high peak intensity of the magnetic 300 reflection of 13 000 photons s -1 in the three-crystal mode and 19 000 photons s -1 in the two-crystal mode, with a peak-to-background ratio of 230:1 and 10:1, respectively, has been achieved. At 80keV, the penetration depth is 7mm. When the path length of the beam through the crystal is varied, the effe… Show more

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Cited by 36 publications
(35 citation statements)
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References 16 publications
(28 reference statements)
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“…We also investigated the temperature variation of the lattice spacing close to the magnetic ordering transition and have found a large magnetoelastic anomaly at the lock-in phase transition. The use of high energy (w100 keV) non-resonant X-ray magnetic scattering in investigating the model antiferromagnetic material MnF 2 with 3d ions has been shown recently [1,2]. This technique has several important advantages over the conventional resonant X-ray magnetic scattering technique: (1) it probes the bulk of the material, (2) extinction free measurement of the magnetic intensities of several magnetic reflections is possible, (3) the measured magnetic intensities with low Q can yield the magnetic spin moments S of the scattering ions, (4) high energy X-rays can penetrate sample environment vessels easily.…”
mentioning
confidence: 99%
“…We also investigated the temperature variation of the lattice spacing close to the magnetic ordering transition and have found a large magnetoelastic anomaly at the lock-in phase transition. The use of high energy (w100 keV) non-resonant X-ray magnetic scattering in investigating the model antiferromagnetic material MnF 2 with 3d ions has been shown recently [1,2]. This technique has several important advantages over the conventional resonant X-ray magnetic scattering technique: (1) it probes the bulk of the material, (2) extinction free measurement of the magnetic intensities of several magnetic reflections is possible, (3) the measured magnetic intensities with low Q can yield the magnetic spin moments S of the scattering ions, (4) high energy X-rays can penetrate sample environment vessels easily.…”
mentioning
confidence: 99%
“…The completely different behavior of the intensities with temperature is obvious. This can be explained by the element specificity of RXS on one hand and by the simplified magnetic scattering cross-section at high energies 24 for small scattering angles HEXMS probes the component of the spin projected onto the normal of the scattering plane, i.e., along U 2 in Fig. 1.…”
Section: Resultsmentioning
confidence: 99%
“…In order to have large enough intensities, measurements were performed at the lowest possible position in Q, (0 0 1.5), since the nonresonant x-ray scattering cross-section includes the magnetic form factor, which decreases rapidly with increasing Q. 24 At 100 keV photon energies, the scattering angles are small, i.e., 1.41 • and 4.23 • for the (0 0 1.5) and (0 0 4.5) reflections, respectively. Therefore, an increase in the HEXMS intensity, e.g., with temperature of any reflection along [0, 0, l], directly indicates an increasing magnetic moment perpendicular to the scattering plane.…”
Section: Resultsmentioning
confidence: 99%
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“…On the other hand, the diffracted intensity due to any weak scattering process will increase proportionally to the sample thickness. This has been of great advantage in the study of structural phase transitions (Rfitt et al, 1997;Poulsen et al, 1996) and ground-state magnetic properties of transition metal compounds (Strempfer et at., 1996) by means of highenergy synchrotron radiation. For a model study of the weak thermal diffuse scattering (TDS) in triple-crystal diffractometry with high-energy synchrotron radiation, perfect single crystals are ideal because TDS is enhanced with respect to the integrated reflecting power of the perfect crystal by about the ratio of t/text "~" 100, if a 1 cm-thick crystal diffracts in transmission geometry.…”
Section: A = T/tex T (1) Tex = [V/(rokfh) ]mentioning
confidence: 99%