The frequency and temperature dependence of the surface
resistance of metallic films was measured by a microwave
micro-strip method under a T-junction structure. Numerical
analysis of micro-strips made of silver-tin (Ag-Sn) alloy, or
good conducting niobium (Nb) films reveals the surface resistances
behaving as nearly a one-half power law dependence on the
frequency, which is in congruence with the results derived from the
free-electron model in simple metals. In addition, we have
specifically investigated the electron transport with a strong
localization effect on the DC temperature-dependent resistivity
in abnormal and normal Nb films. The results indicate a
deviation from a one-half power law may occur in the abnormal
film. This work can be further exploited to measure the
conductivity and penetration depth of metals in multilayered
structure or of superconducting films.