1997
DOI: 10.1063/1.118521
|View full text |Cite
|
Sign up to set email alerts
|

The near band edge photoluminescence of cubic GaN epilayers

Abstract: The near band edge photoluminescence (PL) of cubic GaN epilayers grown by radio frequency (rf) plasma-assisted molecular beam epitaxy on (100) GaAs is measured. Since the PL is excited with an unfocused laser beam it resembles the layer properties rather than the properties of micron-size inclusions or micro crystals. The low temperature PL spectra show well separated lines at 3.26 and 3.15 eV which are due to excitonic and donor-acceptor pair transitions (donor binding energy 25 meV, acceptor binding energy 1… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

13
94
1

Year Published

1998
1998
2017
2017

Publication Types

Select...
9

Relationship

3
6

Authors

Journals

citations
Cited by 156 publications
(108 citation statements)
references
References 14 publications
13
94
1
Order By: Relevance
“…The FWHM of the 381 nm peak was approximately 5.9 nm (130 meV). The FWHM of our β-GaN is wider than those obtained by Okumura et al for β-GaN on a 3C-SiC substrate using ECR-MBE ( 19 meV at 4.2 K) [10] and by As et al for β-GaN on a GaAs substrate using RF-MBE ( 24 meV at 2 K) [11]. The intensity of the yellow band between 500 and 700 nm, which is typically observed for hexagonal GaN, was 1000 times lower than that of the near band-edge peak at 381 nm.…”
Section: Crystal Qualitycontrasting
confidence: 46%
“…The FWHM of the 381 nm peak was approximately 5.9 nm (130 meV). The FWHM of our β-GaN is wider than those obtained by Okumura et al for β-GaN on a 3C-SiC substrate using ECR-MBE ( 19 meV at 4.2 K) [10] and by As et al for β-GaN on a GaAs substrate using RF-MBE ( 24 meV at 2 K) [11]. The intensity of the yellow band between 500 and 700 nm, which is typically observed for hexagonal GaN, was 1000 times lower than that of the near band-edge peak at 381 nm.…”
Section: Crystal Qualitycontrasting
confidence: 46%
“…8 For the group III-nitride material system reports of WZ/ZB heterostructures have not been published so far, with the only exception of the work by Renard et al 9 analyzing the properties of GaN nanowires with a WZ base and a ZB top segment. In GaN, the properties of the ZB phase 10 of its inclusions in a WZ matrix 11 and of stacking faults (SF) (Refs. 12-14) have been studied in the bulk material.…”
Section: Introductionmentioning
confidence: 99%
“…Experimental exciton binding energies (in meV) are taken from Refs. [26][27][28][29][30][31][32][33] and shown only for comparison. We find that the TDA consistently underestimates the exciton binding energies compared to the full calculation.…”
Section: Tda and Exciton Binding Energiesmentioning
confidence: 99%