2015
DOI: 10.1063/1.4928527
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The n-type conduction of indium-doped Cu2O thin films fabricated by direct current magnetron co-sputtering

Abstract: Indium-doped Cu2O thin films were fabricated on K9 glass substrates by direct current magnetron co-sputtering in an atmosphere of Ar and O2. Metallic copper and indium disks were used as the targets. X-ray diffraction showed that the diffraction peaks could only be indexed to simple cubic Cu2O, with no other phases detected. Indium atoms exist as In3+ in Cu2O. Ultraviolet-visible spectroscopy showed that the transmittance of the samples was relatively high and that indium doping increased the optical band gaps… Show more

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Cited by 48 publications
(13 citation statements)
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References 37 publications
(39 reference statements)
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“…The E g corresponded to the sample A, B, C and D were about 2.30, 1.88, 1.69 and 1.66 eV respectively, which presented a decreasing trend with the increasing of the oxygen flow rates. According to the curve of sample A, the E g of the single-phase Cu 2 O film was 2.30 eV, which was in good agreement with the reported value of RF magnetron sputtered Cu 2 O films 34 . The decreasing value of E g was due to the generation of CuO phase, this phenomenon was similar with Alkoy and Prabu's research work 38,39 .…”
Section: Sample Oxygen Flowsupporting
confidence: 89%
“…The E g corresponded to the sample A, B, C and D were about 2.30, 1.88, 1.69 and 1.66 eV respectively, which presented a decreasing trend with the increasing of the oxygen flow rates. According to the curve of sample A, the E g of the single-phase Cu 2 O film was 2.30 eV, which was in good agreement with the reported value of RF magnetron sputtered Cu 2 O films 34 . The decreasing value of E g was due to the generation of CuO phase, this phenomenon was similar with Alkoy and Prabu's research work 38,39 .…”
Section: Sample Oxygen Flowsupporting
confidence: 89%
“…The donor microscopic origin remains unclear with O vacancies, Cu interstitials, inversion layers or extrinsic defects as possible candidates [244] . Due to a self-compensation effect and their reduced dopant solubility, only very few extrinsic impurity atoms have shown a sizable degree of donor doping [245] , [246] . A Cu 2 O p-n homojunction is therefore still challenging (i.e., small grains and poor n-type activation) [247] , [248] , [249] although it is technologically very relevant for optoelectronics owing its low electron affinity [56] .…”
Section: Otf As the Core: Light Harvestersmentioning
confidence: 99%
“…[23] The doping of Cu 2 O with indium resulted in maximum Hall mobility and free carrier density of 7.59 cm 2 V À1 s À1 and 9.9 Â 10 14 cm À3 . [23] In contrast to our observation, the energy bandgap of Cu 2 O increased upon indium doping. [23] The behavior of the indium-doped samples was ascribed to the In 2 O 3 alloy formation mechanism in Cu 2 O films.…”
Section: Resultsmentioning
confidence: 99%
“…It is also worth comparing the effect of the indium slab insertion between two layers of Cu 2 O with the indium-doped Cu 2 O. [23] The doping of Cu 2 O with indium resulted in maximum Hall mobility and free carrier density of 7.59 cm 2 V À1 s À1 and 9.9 Â 10 14 cm À3 . [23] In contrast to our observation, the energy bandgap of Cu 2 O increased upon indium doping.…”
Section: Resultsmentioning
confidence: 99%