2005
DOI: 10.1016/j.jnoncrysol.2005.04.082
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The modulus formalism used in the dielectric analysis of hydroxyapatite and calcium phosphate with titanium formed by dry ball milling

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Cited by 33 publications
(17 citation statements)
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“…The temperature dependence of the dc conductivity (Fig. 7) revealed that the samples do not show Arrhenius behavior, in the same region of temperature measurement, and a comparative analysis becomes difficult [28]. Nevertheless, this behavior, which is not a common ceramic conductivity behavior, suggests that the sample temperature is an important electrical parameter and probably modifies the sample structure, but in a reverse way.…”
Section: Resultsmentioning
confidence: 97%
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“…The temperature dependence of the dc conductivity (Fig. 7) revealed that the samples do not show Arrhenius behavior, in the same region of temperature measurement, and a comparative analysis becomes difficult [28]. Nevertheless, this behavior, which is not a common ceramic conductivity behavior, suggests that the sample temperature is an important electrical parameter and probably modifies the sample structure, but in a reverse way.…”
Section: Resultsmentioning
confidence: 97%
“…6). However, it must be pointed out that the measured dielectric values of the samples are higher than those of the commercial HAP (e 0 $ 5.8 [16,[27][28][29]). This behavior should be assigned to the presence, in these ceramics, of the amorphous phase.…”
Section: Resultsmentioning
confidence: 98%
“…Nevertheless, both XRD and SEM results reveal that the crystallites and particle sizes increase with the rise of the iron oxide concentration. The undoped hydroxyapatite, in the ceramic form, presents a ε′ ~ 11⋅09 (table 1) with crystallite size of ~ 20⋅63 ± 0⋅54 nm (Silva et al 2005(Silva et al , 2006. The HAP-Fe microscopic results (figure 5) show images with a strong variation of the microstructure with iron oxide concentration.…”
Section: Resultsmentioning
confidence: 96%
“…(Silva et al 2005)). This formalism, which minimizes the electro sample interface capacitance contribution at low frequencies, emphasizes small features at low frequencies, revealing that these samples do not present relaxation mechanisms in this frequency range.…”
Section: Resultsmentioning
confidence: 99%
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