Reflectometry is a powerful technique that can be effectively employed for a number of practical applications; in particular, the high versatility, the real-time response, and the potential for practical implementation have contributed to the success of microwave reflectometry for monitoring purposes. In this regard, this paper provides a survey of the current state of the art of reflectometry-based methods for diagnostics and monitoring applications. After a brief overview of the theoretical principles at the base of this technique, the different approaches of microwave reflectometry (time domain, frequency domain, and combined approaches) are fully discussed; particular attention is given to the strategies for enhancing measurement accuracy. Finally, the major practical applications of reflectometry and related results are discussed, thus evidencing current achievements, limitations, and potential.Index Terms-Microwave measurements, microwave reflectometry, microwave spectroscopy, scattering parameters, time-domain reflectometry (TDR).