2018
DOI: 10.2298/ntrp1801053p
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The methodology for active testing of electronic devices under the radiations

Abstract: The meth od ol ogy, de vel oped for ac tive test ing of elec tronic de vices un der the ra di a tions, is pre sented. The test set-up in cludes a gamma-ray fa cil ity, the hard ware board/fix tures and the soft ware tools pur posely de signed and re al ized. The meth od ol ogy is so wide-rang ing to al low us the ver i fi ca tion of dif fer ent classes of elec tronic de vices, even if only ap pli ca tion ex am ples for static ran dom ac cess mem ory mod ules are re ported.Key words: test ing methodology, elec … Show more

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Cited by 1 publication
(3 citation statements)
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“…To get a 2 Gymin -1 dose rate, only 3 sources with lower ac tiv i ties were ex posed. In [15][16][17]34] are avail able de tailed infor ma tion, pho to graphs of the fa cil ity high light ing source lead con tainer, ex po sure de vices, ir ra di a tion area and a work ing ta ble where ex po sure of elec tronic de vices can be re al ized. The struc ture is equipped with do sim e ters, to as sure a safe func tion ing and pre cise dose mea sure ment and is able to of fer a good ver sa tility to carry out sev eral typologies of ir ra di a tion tests.…”
Section: Ir Ra DI a Tionmentioning
confidence: 99%
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“…To get a 2 Gymin -1 dose rate, only 3 sources with lower ac tiv i ties were ex posed. In [15][16][17]34] are avail able de tailed infor ma tion, pho to graphs of the fa cil ity high light ing source lead con tainer, ex po sure de vices, ir ra di a tion area and a work ing ta ble where ex po sure of elec tronic de vices can be re al ized. The struc ture is equipped with do sim e ters, to as sure a safe func tion ing and pre cise dose mea sure ment and is able to of fer a good ver sa tility to carry out sev eral typologies of ir ra di a tion tests.…”
Section: Ir Ra DI a Tionmentioning
confidence: 99%
“…To reach a given RRL, dif fer ent test con fig u rations must be pro vided for each ap pli ca tion. Dur ing its func tion ing, a com po nent was nor mally ex posed to ra di a tion field, with a do sim e ter placed on the com ponent to eval u ate the de vice ab sorbed dose value, while power sup ply and aux il iary cir cuits were pro tected by lead shields [17].…”
Section: Ir Ra DI a Tion Test On Elec Tronic Com Po Nentsmentioning
confidence: 99%
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