The method of parallel-sequential built-in self-testing in integrated circuits of the type SFPGAS

Compaction of test response at self-testing in the programmable logic matrices

“…-detection of 100% of the traditional-single and multiple, stuck-at and logical, short circuiting and breaks that do not extend the set of inputs of the element-faults and almost all nontraditional-extending the number of input elements-faults, see [10];…”