Proceedings of the 12th International Conference on “Electronics, Communications and Computing" 2022
DOI: 10.52326/ic-ecco.2022/el.06
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The method of measuring the parameters of nanostructured sensors

Abstract: In this paper, the data obtained from the research on the development of methods for measuring the parameters of nanostructured sensors, which is based on the use of 2 amplifiers and 2 analog-digital converters for measuring the voltages at the reference voltage source and the voltage drop on the additional resistor, which eliminates the shunt effect of the resistance of the structures investigated by the resistance input of the amplifier.

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