The Meed for Experimentally Determined X-ray Elastic Constants

Marion, R.H.; Cohen, J. B.

doi:10.1154/s0376030800011964

Cited by 21 publications

(19 citation statements)

References 8 publications

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“…non-linearity vs sin2$ for q~ = 0 as frequently measured in practice (angle q~ defined in the rolling plane, with respect to the rolling direction) (e.g. Faninger & Hauk, 1976;Marion & Cohen, 1977;D611e & Cohen, 1980;Hauk, Krug & Vaessen, 1981;Hauk, Vaessen & Weber, 1985).…”

Section: Resultsmentioning

confidence: 97%

Residual stress analysis using overlapping diffraction peaks. Case of textured cubic materials

Brakman¹

1987

J Appl Cryst

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Residual stresses in polycrystalline materials can be determined from the 20 shift of a reflection peak's line profile. Recently, multiple reflections have been used for residual stress analysis in single-phase textured cubic materials. Analogously, residual stresses in twophase materials could be determined from overlapping peaks of both phases. Equations are derived for residual stress analysis using partially or completely overlapping diffraction peaks. Mainly textured cubic materials are considered. It is shown that the so-called quasi-isotropic diffraction elastic constants become connected to texture-dependent quantities. In the examples treated the calculated diffraction strains of three multiple reflections exhibit only small nonlinearities although the intensities oscillate strongly.

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Section: Resultsmentioning

confidence: 97%

Residual stress analysis using overlapping diffraction peaks. Case of textured cubic materials

Brakman¹

1987

J Appl Cryst

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“…It has been observed that X-ray elastic constants of quasi-isotropic polycrystals vary with plastic deformation. Changes as large as 20-509/o have been reported (Taira, Hayashi & Watase, 1968;Prfimmer, 1969;Marion & Cohen, 1977;D611e, Hauk, Kloth, Over & Wichert, 1977) for ½SE(211) of iron. This phenomenon which depends on the reflection hkl is not yet understood and it can severely affect the accuracy of a stress measurement.…”

Section: (6c)mentioning

confidence: 95%

“…At this point in time, theory (Bollenrath, Hauk & Mtiller, 1967) allows for an anisotropic grain coupled to an isotropic matrix, and the variations in X-ray elastic constants (REC) with crystallographic direction match reasonably well with measured values (Macherauch & Wolfstieg, 1977). However, their large change with plastic tensile deformation, found by Taira, Hayashi & Watase (1968), Priimmer (1969), Marion & Cohen (1977) and by D611e, Hauk, Kloth, Over & Wichert (1977), is not yet understood.…”

Section: Introductionmentioning

confidence: 95%

“…This selectivity implies that the elastic constants connecting the measured strains (or change in interplanar spacings) to the stresses will vary with the particular set of planes (hkl) chosen for measurement. A recent review of this problem is contained in references, Marion & Cohen (1977); Macherauch & Wolfstieg (1977). At this point in time, theory (Bollenrath, Hauk & Mtiller, 1967) allows for an anisotropic grain coupled to an isotropic matrix, and the variations in X-ray elastic constants (REC) with crystallographic direction match reasonably well with measured values (Macherauch & Wolfstieg, 1977).…”

Section: Introductionmentioning

confidence: 99%

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The influence of multiaxial stress states, stress gradients and elastic anisotropy on the evaluation of (Residual) stresses by X-rays

Dölle¹

1979

J Appl Cryst

367

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In recent years, nonlinear d vs sin 2 ~O distributions have been observed in stressed materials which cannot be explained by the classical fundamentals of X-ray stress measurement, d is the interplanar spacing measured and ~ is the angle between the surface normal of the sample and the measuring direction. This paper reviews treatments for these nonlinear distributions, including stress gradients, shear stresses and anisotropic X-ray elastic constants. Methods for the evaluation of stresses are reported, and recommendations are given for the practical application of X-ray stress measurement.an understanding of these new experimental results, particularly for textured materials and for materials deformed by large stresses tangent to the surface. From the theory of isotropic elasticity, with do as the lattice parameter of the unstressed material (Macherauch & Mfiller, 1961; Barrett & Massalski, 1966), (d,pq,-do)/do=½s2(hkl)[al cos 2 q) -+-t7 2 sin 2 tp] sin 2 +sl(hkI) [crl +a2], (1) with the principal stresses al and o 2 and the X-ray elastic constants (REC) ½s2(hkl)=[(1 + v)/E]hk~; sl(hkI)=(-v/E) TM. (2a, b)

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“…18^22 The device used in the current study follows an original design by Marion and Cohen. 21 It is designed to fit on a Picker diffractometer. The specimens are dog-bone-shaped substrates that are plated prior to tensile testing.…”

Section: A X-ray Tensile Test Apparatusmentioning

confidence: 99%

X-ray tensile testing of thin films

Noyan

Sheikh

1993

J. Mater. Res.

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The "x-ray tensile test" is the combination of the standard uniaxial tensile test with x-ray diffraction techniques. In this test, in addition to the mechanical stress-strain values usually obtained from a tensile test, one measures the x-ray strain and stress in the diffracting regions of the sample. In multilayer thin films or in multiphase materials, x-ray diffraction enables the determination of strains and stresses in the individual layers or phases. Correlation of the x-ray data with the mechanical stress-strain values may be used to analyze strain and load partitioning within the specimen. In this paper an extended theoretical analysis of this technique and its application to evaporated Cu films on Ni substrates is presented.

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The Meed for Experimentally Determined X-ray Elastic Constants

Cited by 21 publications

References 8 publications

Residual stress analysis using overlapping diffraction peaks. Case of textured cubic materials

Residual stress analysis using overlapping diffraction peaks. Case of textured cubic materials

The influence of multiaxial stress states, stress gradients and elastic anisotropy on the evaluation of (Residual) stresses by X-rays

X-ray tensile testing of thin films

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