1978
DOI: 10.21236/ada060349
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The Measurement of Residual Stresses by X-Ray Diffraction Techniques

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Cited by 9 publications
(10 citation statements)
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References 41 publications
(70 reference statements)
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“…For higher applied stresses we observe a systematic deviation of the stresses measured by the single exposure techniques from the dashed line denoting 1-to-1 correspondence with the two-tilt sin 2 ψ formulation. As noted before, this deviation might be caused by either (i) the elastic grain interaction stresses forming in response to the heterogeneous distribution of plastic flow in the microstructure, and the correspondent heterogeneous elastic residual strain distribution within the diffracting volumes, or (ii) the modification of any existing residual stresses due to plastic flow, or a combination of both effects [5]. This point should be taken into consideration in the selection of instruments/techniques for measurements on samples with complex residual stress distributions, as well as in the interpretation of the results.…”
Section: Resultsmentioning
confidence: 92%
“…For higher applied stresses we observe a systematic deviation of the stresses measured by the single exposure techniques from the dashed line denoting 1-to-1 correspondence with the two-tilt sin 2 ψ formulation. As noted before, this deviation might be caused by either (i) the elastic grain interaction stresses forming in response to the heterogeneous distribution of plastic flow in the microstructure, and the correspondent heterogeneous elastic residual strain distribution within the diffracting volumes, or (ii) the modification of any existing residual stresses due to plastic flow, or a combination of both effects [5]. This point should be taken into consideration in the selection of instruments/techniques for measurements on samples with complex residual stress distributions, as well as in the interpretation of the results.…”
Section: Resultsmentioning
confidence: 92%
“…The X-ray technique measures stresses indirectly by measuring the surface strain, which is indicated by the position of a diffraction peak for a crystal plane, oriented at various angles to the surfaces of a specimen [11]. Residual stresses were measured using peak shift sin 2 y technique with CrK α radiation.…”
Section: Methodsmentioning
confidence: 99%
“…Due to the low dose tested in this experiment, the diffraction elastic constants were assumed to be unchanged by irradiation since it is likely that point defects and dislocation loops would be present at these low doses and therefore would not significantly alter the interplanar response. In the standard case of residual stress measurement in plastically deformed surfaces using the Sin 2 ψ method, such as those achieved using tooling or shot peening, the presence of dislocations does not alter the diffraction elastic constants 73 , so can be thought of as insensitive to this type of defect. However, in the case of materials irradiated to high doses, such as those leading to the formation of voids, precipitation and significant microstructural modification, the diffraction elastic constants would need to be calculated for this condition.…”
Section: Methods 1: Xrd and Dic Monitoring Of Plastic Deformationmentioning
confidence: 99%