2021
DOI: 10.1016/j.optmat.2021.110866
|View full text |Cite
|
Sign up to set email alerts
|

The main role of thermal annealing in controlling the structural and optical properties of ITO thin film layer

Abstract: Here we report on studying the electronic and optical material properties of the technologically-relevant material indium tin oxide (ITO) as a function of thermal annealing. In this work, ITO powder has been prepared utilizing solid-state reaction methods. An electron beam gun technology has been used to prepare a ITO film (~325 nm). The ITO window layer has been investigated at various temperatures. The effects of absolute temperature on the structural, optical, and electrical properties of the prepared ITO t… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
23
1

Year Published

2021
2021
2024
2024

Publication Types

Select...
9

Relationship

0
9

Authors

Journals

citations
Cited by 68 publications
(32 citation statements)
references
References 89 publications
0
23
1
Order By: Relevance
“…The crystalline quality of the films can also be studied by calculating the size of the crystallites of the films using the Debye-Scherrer equation [32,33] (Eq. 1).…”
Section: Crystal Phasementioning
confidence: 99%
“…The crystalline quality of the films can also be studied by calculating the size of the crystallites of the films using the Debye-Scherrer equation [32,33] (Eq. 1).…”
Section: Crystal Phasementioning
confidence: 99%
“…The light output power and LEE of an LED device can be affected by the transmittance of the window layer. ITO window layer exhibits a lower transmittance in UV region as compared with MIPEMOCVD-grown GZO window layer (black line in Figure 7) owing to the strong absorption in UV region [38,51]. The carrier concentrations of n-ZnO and p-GaN were about 10 18 cm −3 ; therefore, the width of the depletion region in n-ZnO and p-GaN is almost equal.…”
Section: Resultsmentioning
confidence: 96%
“…The electrical properties of the TRGO thin film at various temperatures were measured using the four-point-probe (4PP) method [37,38]. The sheet resistance (R s ) measurement was determined using Equation ( 3)…”
Section: Electric Studiesmentioning
confidence: 99%