The magnetoelastic coefficients h<sub>3</sub>and h<sub>4</sub>of

Ahmad, Naeem; Prutton, M.; Whiting, J.S.S.

doi:10.1109/tmag.1972.1067487

Cited by 1 publication

(4 citation statements)

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“…More specifically, the value of the effective magnetisation Me of the present films was found to fluctuate between 404 to 794 G. We ascribed these fluctuations to the differences in the direction and magnitude of the isotropic stress in the films. Nevertheless, the average value of the saturation magnetisation M O calculated for different strain-free films was found to be equal to 492 & 5 G, which is in good agreement with that from previous investigations (3,4, 151. In addition, the average value of the spectroscopic splitting factor (g) was found to be 2.15 -+ 0.02 for the strain-free films, which is also in good agreement with previous measurements [3,4]. A method for the calculation of M e or M O and the g-factor from FMR measurements was described elsewhere [16].…”

Section: Intrinsic Stresssupporting

confidence: 87%

“…Furthermore, the nature of the s t r e s is changed from compressive for strained films to tensile for strain-free ones. (iv) Although the intrinsic stresses for most of the films are quite high, some of them have a value exceeding the elastic limit of the nickel bulk [17] (13.1 X lo9 dyn cm-*); such large stresses are in accord with other data on thin films [3,18]. However, in compensation, the effect of the thermal stress will prevent the total film stress from reaching the yield point.…”

Section: Intrinsic Stresssupporting

confidence: 65%

“…where M O is the saturation magnetisation of the strain-free film, M e is the effective saturation magnetisation of the strained film and h l , h3 and h4 are the magnetoelastic coefficients of the film. The values of the coefficients h l , h3 and h4 have been taken from Ahmad et af [3]. Equation (7) has been used to calculate the total stress and the results are listed in tables 2 and 3.…”

Section: Intrinsic Stressmentioning

confidence: 99%

“…Due to the difficulties of measuring the stress in magnetic epitaxial films, most of the reported measurements of stress were conducted on polycrystalline films. Previous work [1][2][3][4] on single-crystal nickel films was also limited to films prepared under certain deposition conditions. The present study is conducted, therefore, on a large number of single-crystal films of nickel prepared under various deposition conditions to determine the magnitude and direction of the thermal and intrinsic stresses, by suitable ferromagnetic resonance experiments and analysis.…”

Section: Introductionmentioning

confidence: 99%

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Thermal and intrinsic stresses in single-crystal nickel films

Hussain

1989

J. Phys.: Condens. Matter

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The thermal and intrinsic stresses in single-crystal nickel films, in the thickness range 500-3000 AA, prepared by epitaxial growth onto the (100) cleaved surfaces of NaF, LiF, NaCl and MgO have been obtained. Calculated results from ferromagnetic resonance experiments show that the magnitudes and directions of the film stresses depend on the nature of the substrate conditions and on the sequential ordering of the deposited layers. The experimental results revealed that the thermal stresses, which are elastic and isotropic in character, are larger than the intrinsic stresses and can be of either compressive or tensile type. This type of stress disappears after the film is removed from the substrate. The present results also show that there is no single model which sufficiently accounts for the magnitudes of the intrinsic stresses in the strained films.

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Section: Intrinsic Stresssupporting

confidence: 87%