The kinetics of photodissolution of Ag in amorphous As2S3 films

Silver photo-diffusion and photo-induced macroscopic surface deformation of Ge33S67/Ag/Si substrate

“…4. As shown in the figure, the neutron reflectivity in the total reflection region dropped at 30 min for Ge 33 S 67 1500 Å /Ag 500 Å /Si and 27 min for Ge 33 S 67 2000 Å /Ag 500 Å /Si, respectively. The decrease of the neutron reflectivity is rapid in Ge 33 S 67 2000 Å /Ag 500 Å /Si, while it is gentle in Ge 33 S 67 1500 Å /Ag 500 Å /Si.…”

“…stack seems to saturate approximately at 300 Å , while it seems to continue to decrease for Ge 33 S 67 2000 Å /Ag 500 Å /Si stack. The difference between 2nd and 3rd peaks could also indicate the presence of Ag layer indirectly, and the result seems to be consistent with that of the first peak.…”

“…Summing up these results in Figs. 1-3, it was found that: (1) the macroscopic surface roughness started to be produced at 30 min for Ge 33 S 67 1500 Å /Ag 500 Å /Si, and at 27 min for Ge 33 S 67 2000 Å /Ag 500 Å /Si; (2) there could be two diffusion or reaction processes, 0-1 min and 1-30 min, for Ge 33 S 67 1500 Å /Ag 500 Å /Si; and (3) there could also be two diffusion or reaction processes, 0-17 min and 17-27 min, for Ge 33 S 67 1500 Å /Ag 500 Å /Si.…”

“…Actually, Goldschmidt and Rudman have shown that the reaction rate, k, is basically followed by the relationship; k / aI 0 exp½Àad, where I 0 is the light intensity of the chalcogenide surface and d is the thickness of the chalcogenide layer, from the experimental result for a-As 2 S 3 /Ag. 33 Tanaka 28 has also shown the chalcogenide layer dependence on the reaction rate. These results are consistent with the present one, indicating that the reaction rate is slower for the thicker chalcogenide layer.…”

“…[12][13][14][15] From the measurements, time variation of the thicknesses of silver and reaction layers was clarified, and it was found that silver diffusion kinetics markedly depends on Ge compositions and the direction of light illumination (from Ag-side or Ge-chalcogenide-side). In this paper, we report the results of neutron reflectivity measurements of Ge 33 S 67 1500 Å /Ag 500 Å /Si substrate and Ge 33 S 67 2000 Å /Ag 500 Å /Si substrate stacks and to show how silver ions diffuse into Ge 33 S 67 films, depending on the thickness of chalcogenide layer. In addition, through the measurements, we found that macroscopic pattern was formed by extended light exposure.…”