The investigation of thickness-dependent mono-fractal, optical and optoelectronics properties of sputtered silver thin film for silicon solar cell

Kumar, Chandra; Shrivastav, Monika; Escrig, Juan; Campos, Luis-Padilla; Martinez, Arturo I.; Silva, Héctor; Zarate, Antonio

doi:10.1016/j.vacuum.2024.113247

Vacuum

2024

DOI: 10.1016/j.vacuum.2024.113247

|View full text |Cite

The investigation of thickness-dependent mono-fractal, optical and optoelectronics properties of sputtered silver thin film for silicon solar cell

Chandra Kumar,

Monika Shrivastav,

Juan Escrig

et al.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

Supporting

Mentioning

Contrasting

Year Published

2024

Publication Types

Select...

Article3

Relationship

Self Cite0

Independent3

Authors

Journals

Cited by 3 publications

References 78 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

The correlation between surface scaling behavior and optical properties of NiO thin films nanostructures: An investigation based on fractal concepts

Kumar,

Shrivastav,

Escrig

et al. 2024

Ceramics International

View full text Add to dashboard Cite

The correlation between surface scaling behavior and optical properties of NiO thin films nanostructures: An investigation based on fractal concepts

Kumar,

Shrivastav,

Escrig

et al. 2024

Ceramics International

View full text Add to dashboard Cite

Impact of fractal dimension and lateral correlation length on surface plasmon resonance activity in sputtered silver layers

Kumar,

Shrivastav,

Escrig

et al. 2024

Nano-Structures & Nano-Objects

View full text Add to dashboard Cite

Fractal formalism in crystallized-Ge via Al induced crystallization under ion irradiation

Meher,

Maity,

Yadav

et al. 2024

Vacuum

View full text Add to dashboard Cite

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

hi@scite.ai

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

The investigation of thickness-dependent mono-fractal, optical and optoelectronics properties of sputtered silver thin film for silicon solar cell

Cited by 3 publications

References 78 publications

The correlation between surface scaling behavior and optical properties of NiO thin films nanostructures: An investigation based on fractal concepts

The correlation between surface scaling behavior and optical properties of NiO thin films nanostructures: An investigation based on fractal concepts

Impact of fractal dimension and lateral correlation length on surface plasmon resonance activity in sputtered silver layers

Fractal formalism in crystallized-Ge via Al induced crystallization under ion irradiation

Contact Info

Product

Resources

About