The interpretation of XPS spectra: Insights into materials properties

Pleomorphic structural imperfections caused by pulsed Bi-implantation in the bulk and thin-film morphologies of TiO2

“…The Bi 4f spectrum for α- Formation of Bi-O bonds after embedding into titanium dioxide can occur because of the implantation stimulated distortion and disruption of initial Ti -O bonding with posterior rearrangement of oxygen sublattice of Bi-implanted TiO 2 -host. Usually these distortions of initial structure are well recognized by the XPS of appropriate core-levels because they appear as extrinsic reasons of variations in BE's value and full width at a half maximum (FWHM) of XPS spectrum [24]. Thus the XPS O 1s analysis will be useful for an identification of oxygen sublattice distortions caused by implantation (see Fig.…”

Toward a computational and experimental model of a poly-epoxy surface

“…The binding energies shown are the negative value of the molecular orbitals energies. Therefore, absolute values are not correct because (i) XPS binding energies correspond to a multi-step process where photoelectrons interact with the created holes, with the matrix and with their image before and after extraction into vacuum, (ii) temperature is not considered, (iii) of the limitation of Kohn-Sham orbital energies as reflecting initial state effects [30]. Nevertheless, chemical shifts can be used if one consider the latter processes constant in a given energy domain.…”

X-Ray Photoelectron Spectroscopic Characterization of Chemically Modified Electrodes Used as Chemical Sensors and Biosensors: A Review

“…It was shown that the energy separation between the two major excursions in the first derivative of the carbon KVV (this notation indicates the second and third electron of the Auger process are valence band electrons) region can discriminate between sp 2 and sp 3 carbons [24]. Moreover, it is also possible calculating the so-called modified Auger parameter, α', which can also give speciation information and is independent on charging effects [16][17][18][19][20][21][22]. Auger emission steps.…”

“…Several qualified books and reviews (see for example [16][17][18][19][20][21][22]) present principles and practices of XPS. Nevertheless, the very basic principles of the technique are detailed below for allowing the inexperienced reader a reasonable understanding of the reviewed results.…”

“…XPS is aimed at studying photoemission from core level photoelectrons. The simplified equation describing the photoionization process is [16][17][18][19][20][21][22] KE = h − BE (1) in which KE (eV) is the kinetic energy of the photoemitted electron, BE (eV) its binding energy, hν is the X-ray energy (eV). If a positive charge is left on the sample surface by the photoemission process, photoelectrons appear at somewhat lower KE values.…”