The Intensity of Emission of Characteristic X-Radiation

Internal-detector electron holography is one of the atomic resolution holography methods to analyze local structures around specific elements by reconstructing 3D atomic images, and it can measure the holograms with table-top electron microscopes. Since the internal-detector electron holography uses electron beams as holographic waves, understanding of behaviors of the electron beams in solids is important to optimize the performance of the internaldetector electron holography. Here, we defined an evaluation function for the hologram measurements, f (E), which is obtained from characteristic X-ray intensity and the holographic amplitude with Monte Carlo simulation. Using this formula, the best electron energy for the Ti-K hologram from SrTiO3 bulk was estimated to be 0.5 keV above the Ti-K X-ray ionization energy. Next, the best energies of the electron beam for Pt thin film was calculated with varying its thickness since the quality of holographic data are degraded by the characteristic X-rays from the deep region of the sample due to breaking of the coherence of the incident electron beams. The energy profile of f (E) for the thin film is quite different from that for bulk. The estimated energies were as wide as 5.0-10.0 keV above the Pt-M X-ray ionization energy. Moreover, the best thickness of thin film for hologram measurement was obtained to be about 10 nm, which is close to the inelastic mean free path of the electron in the sample.

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“…where E is the kinetic energy of the incident electron and V K is the ionization energy of the K shell, respectively [19]. In Fig.…”

Section: Theorymentioning

confidence: 99%

Optimization of Incident Electron Energy for Internal-Detector Electron Holography with Monte Carlo Simulation

Uesaka

Hayashi

Matsushita

et al. 2011

e-J. Surf. Sci. Nanotechnol.

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“…For aluminium and the lighter elements considered below, Q was obtained from the formula of Worthington and Tomlin (1956). Burhop's (1952) formula gives Wk = 0·0234, and that of Laberrigue-Frolow and Radvanyi (1956) gives Wk = 0·0267.…”

Section: J1-w Iementioning

confidence: 99%

“…Of these effects, the last three have been carefully discussed by Campbell (1963) in a paper presenting experimental measurement on emission from elements of low atomic numbers. He found a large discrepancy between his measurements on aluminium and the calculations of Worthington and Tomlin (1956). He rightly concluded that this discrepancy was due to an error in the value of k used in the calculations.…”

Section: Introductionmentioning

confidence: 96%

“…A modified theory was given by Archard (1960) and also by Metchnik and Tomlin (1963) who used the multiple electron scattering theory of Lewis (1950) to allow for scattering of the electron beam in the target. These latter authors also compared the results of their theory, and of the earlier theory ofW orthington and Tomlin (1956), with experimental measurements on radiation from silver, copper, and chromium targets. They showed that the improved theory of Metchnik and Tomlin (1963) led to reasonably good agreement between calculation and experiment.…”

Section: Introductionmentioning

confidence: 98%

“…Worthington and Tomlin (1956) presented a theoretical discussion of the problem of calculating the number of K ex quanta emitted from a thick target for each incident electron. A modified theory was given by Archard (1960) and also by Metchnik and Tomlin (1963) who used the multiple electron scattering theory of Lewis (1950) to allow for scattering of the electron beam in the target.…”

Section: Introductionmentioning

confidence: 99%

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Calculations of Intensities of Emission of Characteristic X-Radiation

Tomlin¹

1964

Aust. J. Phys.

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SummaryIntensities of emission of characteristic X-radiation from thick targets of silver, copper, chromium, aluminium, carbon, boron, and beryllium have been calculated using the theory of Metchnik and Tomlin (1963) and the results have been compared with experimental data. The effect of the backscattering of electrons from the target has been examined in detail, and the correcting factor k, which allows for this and for the effects of fluorescence yield and indirect excitation by the white radiation, has been tabulated.

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Quantitative AES VII. The ionization cross-section in AES

Seah

Gilmore

1998

Surf. Interface Anal.

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Inner shell ionization cross‐sections are analyzed for use with Auger electron spectroscopy (AES). Correlations of the cross‐sections of Gryzinski, Casnati et al., Jakoby et al. and Drawin are made with experimental data from the digital Auger database. Jakoby et al.'s cross‐section is realistic for K shell ionizations but can become negative for other shells unless modified, so is of limited use for AES. Results for the ratios of experimental and calculated intensities for electron beam energies of 5 keV and 10 keV, for overpotentials in the range 2–60, are used to rank the effectiveness of the remaining three cross‐sections. The experimental ratios show means and scatter standard deviations of 1.01±0.12, 0.99±0.05 and 1.04±0.09 when compared with the predictions for the cross‐sections of Gryzinski, Casnati et al. and Drawin, respectively. Casnati et al.'s cross‐section provides the best correlation, with the goodness of fit being similar for ionizations in the K, L, M and N shells. Casnati et al.'s cross‐section is therefore recommended for future use in AES. The use of Gryzinski's or of Drawin's cross‐sections, by comparison, can lead to errors as high as 50% at the low value of 1.5 for the overpotential (i.e. for high‐energy Auger electrons). © Crown copyright 1998. Reproduced with the permission of the Controller of Her Majesty's Stationery Office.

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The Intensity of Emission of Characteristic X-Radiation

Cited by 154 publications

References 12 publications

Optimization of Incident Electron Energy for Internal-Detector Electron Holography with Monte Carlo Simulation

Optimization of Incident Electron Energy for Internal-Detector Electron Holography with Monte Carlo Simulation

Calculations of Intensities of Emission of Characteristic X-Radiation

Quantitative AES VII. The ionization cross-section in AES

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