2017 18th International Conference on Electronic Packaging Technology (ICEPT) 2017
DOI: 10.1109/icept.2017.8046556
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The influence of thermal aging on reliability of Sn-58Bi interconnects

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“…Table 3 shows that although the IMC thickens after aging, it is not over-thickened, resulting in good shear strength. It has been shown that the thickness of IMC at the Sn58Bi/Cu interface increases linearly with the square root of the aging time [34][35][36][37], that is, the IMC growth at the interface in solder joint follows the empirical diffusion formula:…”
Section: Shear Test Of the Fully Mixed Solder Jointmentioning
confidence: 99%
“…Table 3 shows that although the IMC thickens after aging, it is not over-thickened, resulting in good shear strength. It has been shown that the thickness of IMC at the Sn58Bi/Cu interface increases linearly with the square root of the aging time [34][35][36][37], that is, the IMC growth at the interface in solder joint follows the empirical diffusion formula:…”
Section: Shear Test Of the Fully Mixed Solder Jointmentioning
confidence: 99%