“…7(a)) were fitted by using an equivalent circuit as shown in Fig. 7(c) based on a diffusion-recombination model [35,36] to extract the electron transport parameters, including the electron transport resistance within the ZnO mesoporous film (R w , R w = r w L, where L is the film thickness), the charge transfer resistance (R k ) (R k = r k / L) related to the recombination of electrons at the ZnO/ electrolyte interface, and the chemical capacitance of the ZnO electrode (C μ , C μ = c μ L). In addition, other circuit elements were introduced to modify the equivalent circuit model, i.e., the series resistance for the total transport resistance of the FTO substrates and external circuits (R S ), the impedance of the diffusion of I 3 − in the electrolyte (Z N ), the resistance (R Pt ) and the capacitance (C Pt ) at the Pt/electrolyte interface, and the resistance (R FTO ) and the capacitance (C FTO ) at the FTO/electrolyte interface, and the resistance (R FZ ) and the capacitance (C FZ ) at the FTO/ZnO interface.…”