The Influence of Photoionization on the Loss Rate in a Mg MOT

Ruschewitz, F.; Peng, Jin-Long; Degner, R.; Hinderthür, H.; Scheller, D.; Bettermann, D.; Ertmer, W.

doi:10.1109/eqec.1996.561704

EQEC 96 1996 European Quantum Electronic Conference EQEC-96 1996

DOI: 10.1109/eqec.1996.561704

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The Influence of Photoionization on the Loss Rate in a Mg MOT

F. Ruschewitz¹,

Jin-Long Peng²,

R. Degner³

et al.

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1996

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“…The corresponding trap lifetime, as determined from the fluorescence decay, is 0.5 s for the parameters given above and shows a strong dependence on the frequency and intensity of the trapping beams. We explain this by the fact that photoionization of the trapped atoms in the excited state is the dominant trap loss mechanism [17].…”

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confidence: 99%

Statistical investigations on single trapped neutral atoms

Ruschewitz¹,

Bettermann²,

Peng³

et al. 1996

Europhys. Lett.

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Single neutral atoms have been stored in a magneto-optical trap and imaged with the help of a CCD camera. The trapping of individual atoms is marked by steps in the fluorescence signal corresponding to the capture or loss of a single atom. The statistics of these capture and loss processes is explained by means of a birth-death model. The spatial distribution and the trap losses are investigated for the single-atom case and compared with the behaviour of a cloud of up to 2 • 10 5 atoms.

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mentioning

confidence: 99%

Statistical investigations on single trapped neutral atoms

Ruschewitz¹,

Bettermann²,

Peng³

et al. 1996

Europhys. Lett.

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The Influence of Photoionization on the Loss Rate in a Mg MOT

Cited by 1 publication

References 5 publications

Statistical investigations on single trapped neutral atoms

Statistical investigations on single trapped neutral atoms

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