2013
DOI: 10.1016/j.jallcom.2013.07.194
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The influence of milling and annealing on the structural and magnetic behavior of Nd2Fe14B/α-Fe magnetic nanocomposite

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Cited by 14 publications
(7 citation statements)
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“…In general, XPS is a very useful technique in the compositional determination of surfaces. In the case of nanostructured materials that can contain several phases, through this method, when associated with Ar ions etching, complex quantitative compositional determinations can be obtained 50 . For the compositional analysis all the integral intensities were calibrated by using the relative sensitivities, transmission and electronic mean free path factors as given in CASA software database.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…In general, XPS is a very useful technique in the compositional determination of surfaces. In the case of nanostructured materials that can contain several phases, through this method, when associated with Ar ions etching, complex quantitative compositional determinations can be obtained 50 . For the compositional analysis all the integral intensities were calibrated by using the relative sensitivities, transmission and electronic mean free path factors as given in CASA software database.…”
Section: Resultsmentioning
confidence: 99%
“…Each of the two samples were subject to consecutive etchings with Ar ions until the shape and intensity of XPS spectra remained unchanged. At this stage, the quantitative composition of samples can be calculated by taking into account the escape depths of each identified component 50 52 . To account this, the calculated integral intensities were divided to the corresponding escape depths expressed in nm.…”
Section: Resultsmentioning
confidence: 99%
“…In general, XPS is a very useful technique in the compositional determination of surfaces. In the case of nanostructured materials that can contain several phases, through this method, when associated with Ar ions etching, complex quantitative compositional determinations can be obtained [44]. For the compositional analysis all the integral intensities were calibrated by using the relative sensitivities, transmission and electronic mean free path factors as given in CASA software database.…”
Section: The Xps Analysis Of Samplesmentioning
confidence: 99%
“…Each of the two samples were subject to consecutive etchings with Ar ions until the shape and intensity of XPS spectra remained unchanged. At this stage, the quantitative composition of samples can be calculated by taking into account the escape depths of each identi ed component [44][45][46]. To account this, the calculated integral intensities were divided to the corresponding escape depths expressed in nm.…”
Section: The Xps Analysis Of Samplesmentioning
confidence: 99%
“…The peaks separation value was found to be 22.5 eV, which corresponds to the trivalent neodymium (Nd 3+ ) in Nd-O bonding. [43][44][45].…”
Section: X-ray Photoelectron Spectroscopy (Xps)mentioning
confidence: 99%