The RF and microwave response of YBa2Cu307-S films on Ba,Srj-,TiOs/MgO substrates was investigated in an external static magnetic field. Films with a varying thickness, orientation and type of structure were studied in order to understand the mechanisms of RF and microwave residual losses. The measurements of surface resistance (R) as a function of the film t h i c h s s and static ( H ) and RF (H-) magnetic field are discussed. Analysis of theoretical and experimental R(H) dependences has shown that residual RF and microwave losses occur in a static magnetic field on Josephson junctions formed at grain boundaries and at microblock boundaries with trapped Abrikosov vortices and on Abrikosov vortices themselves, and are also caused by non-superconductive inclusions.