It is well known that photons with energies ranging from 1 to 1.35 eV induce strong transformations on the photocurrent response of semiinsulating bulk GaAs. There are two photomemory effects which are strongly dependent on the sample kind; so there are samples that — exhibit an enhancement of the 1 to 1.35 eV extrinsic photocurrent after sufficiently long excitation below 120 K, whereas other samples show optical quenching of the photocurrent under the same excitation conditions. These phenomena can be understood on the basis of strong changes on the configuration of deep traps under illumination with photons ranging from 1 to 1.35 eV. The new configuration of the deep traps can be originated by defect reactions involving association and/or dissociation of complex defects, when the electronic occupation is changed by these photons. In this context, it should be very interesting to test the behaviour of shallow traps during the defect reaction mechanism. Therefore the photocurrent is studied in the spectral region of the band gap edge, after excitation with 1 to 1.35 eV photons. The results obtained confirm that shallow trap concentrations are strongly influenced by variations in the charge state of deep traps. Thus samples characterized by optical quenching of the extrinsic photocurrent undergo a complete quenching of the near intrinsic photocurrent (1.45 eV band), whereas samples showing optical enhancement of the extrinsic photocurrent, exhibit an enhancement of the 1.45 eV near intrinsic photocurrent band, whose maximum is also shifted towards 1.475 eV.