The improvement of the characteristics of ramp-edge junctions with interface modified barriers

Ito, Takahiro; Horibe, Masahiro; Inagaki, Y.; Fujimaki, Akira; Hayakawa, Hisao

doi:10.1088/0953-2048/14/12/315

Cited by 2 publications

(1 citation statement)

References 9 publications

(9 reference statements)

Supporting

Mentioning

Contrasting

Order By: Relevance

“…As for the PGO deposition process [8], we found a reduction in excess current of the junctions, and a reduction in I c to 1/10 per 0.5 PGO unit cell. For ramp junctions, little effect of the PGO deposition was found [11]. We now focus on the dependence of the properties on J c , which corresponds to the thickness of the barrier layer.…”

Section: Resultsmentioning

confidence: 99%

Investigation of the electrical properties of vertically stacked interface-treated Josephson junctions

Yoshinaga

Izawa

Wakita

et al. 2004

Supercond. Sci. Technol.

Self Cite

View full text Add to dashboard Cite

In order to understand the barrier structure of vertically stacked-type interface-treated Josephson junctions, we compared the electrical properties of the stacked junctions with those of ramp-edge junctions. With increasing critical current density (Jc), IcRn products for both types of junction increased and the spread of critical current decreased. Nevertheless, the stacked junctions had higher IcRn products and lower spreads than those of ramp-edge junctions with Jc of the same order. Moreover, we investigated the temperature dependence of the critical current and the conductance for junctions with Jc values of around 103 A cm−2. No significant difference was found for the dependence of Ic. In contrast, the conductance of stacked junctions somewhat increased with increasing temperature, which resulted in the reduction of IcRn. The reduction is small at 4.2–30 K; we thus think that the reduction is negligible for applications.

show abstract

Section: Resultsmentioning

confidence: 99%

Investigation of the electrical properties of vertically stacked interface-treated Josephson junctions

Yoshinaga

Izawa

Wakita

et al. 2004

Supercond. Sci. Technol.

Self Cite

View full text Add to dashboard Cite

show abstract

Hysteresis Control of Interface-Engineered Ramp-Edge Junctions for Single-Flux-Quantum Circuits

Horibe

Hato

Wakana

et al. 2004

Jpn. J. Appl. Phys.

View full text Add to dashboard Cite

We study the level spacing distribution p(s) in the spectrum of random networks. According to our numerical results, the shape of p(s) in the Erdős-Rényi (E-R) random graph is determined by the average degree k and p(s) undergoes a dramatic change when k is varied around the critical point of the percolation transition, k = 1. When k 1, the p(s) is described by the statistics of the Gaussian orthogonal ensemble (GOE), one of the major statistical ensembles in Random Matrix Theory, whereas at k = 1 it follows the Poisson level spacing distribution. Closely above the critical point, p(s) can be described in terms of an intermediate distribution between Poisson and the GOE, the Brodydistribution. Furthermore, below the critical point p(s) can be given with the help of the regularized Gamma-function. Motivated by these results, we analyse the behaviour of p(s) in real networks such as the internet, a word association network and a protein-protein interaction network as well. When the giant component of these networks is destroyed in a node deletion process simulating the networks subjected to intentional attack, their level spacing distribution undergoes a similar transition to that of the E-R graph.

show abstract

The improvement of the characteristics of ramp-edge junctions with interface modified barriers

Cited by 2 publications

References 9 publications

Investigation of the electrical properties of vertically stacked interface-treated Josephson junctions

Investigation of the electrical properties of vertically stacked interface-treated Josephson junctions

Hysteresis Control of Interface-Engineered Ramp-Edge Junctions for Single-Flux-Quantum Circuits

Contact Info

Product

Resources

About