The impact of mission profile on system level reliability of cascaded H-bridge multilevel PV inverter

Gatla, Ranjith Kumar; Zhu, Guorong; Lu, Jianghua; Kshatri, Sainadh Singh; Devineni, Gireesh Kumar

doi:10.1016/j.microrel.2022.114639

Cited by 4 publications

(2 citation statements)

References 14 publications

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“…Then a voltage/reactive optimization model of the distribution network taking into account the dependability of photovoltaic power supply can be established on this basis. The reliability of photovoltaic power provision is significantly influenced by the IGBT component, with IGBT-related malfunctions contributing to over 30% of total photovoltaic inverter failures [29]. The lifetime expectancy and dependability appraisal of photovoltaic power supply can focus on the life expectancy and dependability appraisal of IGBT.…”

Section: Igbt Reliability Evaluation Based On Mission Profilementioning

confidence: 99%

Reactive voltage control strategy of distribution network considering the reliability of photovoltaic power supply

Liang,

Li,

Zhang

et al. 2023

STET

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Photovoltaic power actively regulates the reactive power of the active distribution network, leading to the increase of output current of the photovoltaic inverter. Consequently, the temperature rise significantly impacts the maximum junction temperature of the Insulated Gate Bipolar Transistor (IGBT), leading to fluctuations in the junction temperature. To realize the active support of the reactive power of the photovoltaic power supply and ensure its reliable operation, a reactive voltage control strategy of the active distribution network considering the reliability of the photovoltaic power supply is proposed. Considering the reactive power support capability of the distributed photovoltaic power, a multi-objective reactive power optimization model for active distribution networks is established based on IGBT maximum junction temperature, distribution network losses, and photovoltaic active power reduction. The effectiveness of the proposed strategy in enhancing the minimum lifetime, average lifetime, and reliability of photovoltaic power sources is verified using the IEEE 33-node standard distribution system. The results show that under the strategy proposed in this paper, the average junction temperature and junction temperature fluctuation of IGBT are effectively reduced, and the minimum lifetime and average lifetime of all IGBTs are increased by 8 years and 4 years respectively.

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Section: Igbt Reliability Evaluation Based On Mission Profilementioning

confidence: 99%

Reactive voltage control strategy of distribution network considering the reliability of photovoltaic power supply

Liang,

Li,

Zhang

et al. 2023

STET

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“…This is why the power conversion system's thermal management must be performed properly. In [15] presented two typologies for the reliability of power electronics components. The authors of this paper used an approximate method to perform a better comparison between the parts count method and the parts stress method.…”

Section: Introductionmentioning

confidence: 99%

Effect of Junction Temperature on System Level Reliability of Grid Connected PV Inverter

Gatla,

Ramesh,

Rao

et al. 2023

JNMES

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The number of cycles to the end of life for high-power IGBT modules is expressed as a function of the stress parameters in the model. Most of the time, these models are generated on the basis of experimental data from accelerated power-cycling experiments that are done at preset temperatures and stress levels. This paper proposed a systematic Reliability evaluation process for large-scale commercial and utility-level PV power systems. The major contribution of this work is the quantification of the impact of junction temperature on the failure rates of critical components such as PV Inverters and capacitors. Usually, the reliability assessment of the power electronic switch such as IGBT and inverter focused on component level, whereas much fewer cases discussed the Reliability evaluation for the entire PV system. In light of the above concerns, this article discussed the effect of junction temperature on the lifetime of IGBT modules, and the relevant lifetime factor is modelled. This study enables us to include the junction temperature effect on the lifetime model of IGBT modules under the given mission profiles of the converter.

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Enhancing Electric Vehicle Charging with Dynamic Adaptation: A Machine Learning Approach to Improving Grid Alignment Precision

Rajani,

Manjunatha,

Gopal

et al. 2024

2024 International Conference on Communication, Computer Sciences and Engineering (IC3SE)

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The impact of mission profile on system level reliability of cascaded H-bridge multilevel PV inverter

Cited by 4 publications

References 14 publications

Reactive voltage control strategy of distribution network considering the reliability of photovoltaic power supply

Reactive voltage control strategy of distribution network considering the reliability of photovoltaic power supply

Effect of Junction Temperature on System Level Reliability of Grid Connected PV Inverter

Enhancing Electric Vehicle Charging with Dynamic Adaptation: A Machine Learning Approach to Improving Grid Alignment Precision

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