The Impact of a Taper Impedance Transformation on the TRL De-Embedding Error

Louro, João; Nunes, Luís C.; Barradas, Filipe M.; Cabral, Pedro M.; Pedro, José C.

doi:10.1109/jmw.2024.3405018

IEEE J. Microw.

2024

DOI: 10.1109/jmw.2024.3405018

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The Impact of a Taper Impedance Transformation on the TRL De-Embedding Error

João Louro,

Luís C. Nunes,

Filipe M. Barradas

et al.

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The Impact of a Taper Impedance Transformation on the TRL De-Embedding Error

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References 37 publications

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