The Imaging X-Ray Polarimetry Explorer (IXPE): technical overview IV

Ramsey, Brian D.; Attinà, Primo; Baldini, Luca; Barbanera, M.; Baumgartner, W. H.; Bellazzini, R.; Bladt, Jeff; Bongiorno, Stephen D.; Brez, A.; Castellano, Simone; Carpentiero, Rita; Castronuovo, Marco; Cavalli, Luca; Cavazutti, Elisabetta; D’Amico, F.; Citraro, Saverio; Costa, E.; Deininger, William D.; D’Alba, Elisa; Delmonte, Ettore; Dietz, Kurtis L.; Lalla, N. Di; Marco, Alessandro Di; Persio, G. Di; Donnarumma, I.; Fabiani, Sergio; Ferrazzoli, Riccardo; Footdale, Joseph; Head, Michael; Kalinowski, William; Kolodziejczak, Jeffery J.; Latronico, L.; Lefevre, Carlo; Lorenzi, Paolo; Lucchesi, Leonardo; Maldera, S.; Manfreda, Alberto; Mangravati, Elio; Marshall, Herman L.; Matt, Giorgio; Minuti, M.; Mize, Rondal; Muleri, Fabio; Nasimi, Hikmat; Negri, B.; Nuti, Alessio; O’Dell, Stephen L.; Orsini, Leonardo; Osborne, Darren; Pentz, Christina; Pilia, M.; Perri, M.; Pesce-Rollins, Melissa; Peterson, Colin; Pinchera, Michele; Puccetti, S.; Rankin, John; Ratheesh, Ajay; Romani, Roger W.; Sarra, Paolo; Santoli, Francesco; Sciortino, Andrea; Schroeder, Christopher; Sgrò, C.; Soffitta, P.; Spandre, G.; Tennant, Allyn F.; Tobia, Antonino; Thomas, Nicholas E.; Trois, A.; Vimercati, Marco; Wedmore, Jeffery; Weisskopf, Martin C.; Xie, Fei; Zanetti, Francesco; Alexander, Cheryl D.; Allen, D. Zachery; Amici, Fabrizio; Andersen, Jason; Antonelli, A.; Antoniak, Spencer; Bachetti, Matteo; Baggett, Randy; Bonino, Rafaella; Boree, Christopher; Borotto, Fabio; Breeding, Shawn; Brienza, Daniele; Byggott, H.Kyle; Caporale, Ciro; Cardelli, Claudia; Ceccanti, M.; Centrone, Mauro; Dolan, David; Evangelista, Y.; Ferrant, Kevin; Ferrie, MacKenzie; Forsyth, Brent; Foster, Michelle; Garelick, Benjamin; Gunji, Shuichi; Gurnee, Eli; Hibbard, Grant; Johnson, Samantha; Kelly, Eric; Kilaru, Kiranmayee; Monaca, Fabio La; Roy, Shelley Le; Lofredo, Pasqualino; Maddox, Tyler; Magazzù, G.; Marengo, Marco; Marrocchesi, Alessandra; Massaro, F.; Mauger, David; McCracken, Jeffrey; McEachen, Michael E.; Mereu, Paolo; Mitchell, Scott; Mitsuishi, Ikuyuki; Morbidini, Alfredo; Mosti, Federico; Nguyen, Toan; Negro, Michela; Nitschke, Isaac; Onizuka, Mitch; Oppedisano, C.; Pacheco, Richard; Paggi, A.; Painter, Will; Pavelitz, Steven D.; Piazzolla, Raffaele; Profeti, A.; Ranganathan, Jaganathan; Reedy, Lee; Root, Noah; Rubini, A.; Ruswick, Stephanie; Sánchez, J.; Scalise, E.; Seek, Tim; Sosdian, Kalie; Speegle, Chet O.; Tamagawa, Toru; Tardiola, Marcello; Valerie, Robert; Walden, Amy L.; Weddendorf, Bruce; Welch, David

doi:10.1117/12.2595302

Cited by 4 publications

(1 citation statement)

References 4 publications

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“…The Imaging X-ray Polarimetry Explorer (IXPE) will be the first mission designed specifically for x-ray polarimetry. 1,2 It will operate over the 2 to 8 keV energy band and will measure polarization from most classes of x-ray sources including supernova remnants, stellar mass black holes, neutron stars, and active galactic nuclei. IXPE, a NASA-funded small explorer mission, with substantial contributions from the Italian Space Agency (Agenzia Spaziale Italiana [ASI]), was launched on December 9, 2021, into an equatorial orbit of altitude 600 km.…”

Section: Introductionmentioning

confidence: 99%

Optics for the imaging x-ray polarimetry explorer

Ramsey

2022

J. Astron. Telesc. Instrum. Syst.

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The Imaging X-ray Polarimetry Explorer, a NASA small explorer mission, will be the first mission dedicated to x-ray polarimetry. The payload consists of three identical telescopes, each comprising a mirror module assembly (MMA) with a polarization-sensitive detector at its focus. We describe all aspects of the MMA, from initial optical and mechanical design considerations to meet program requirements through mirror shell fabrication, mirror shell integration and module assembly, environmental testing, x-ray calibration, and on-ground and on-orbit alignment.

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Section: Introductionmentioning

confidence: 99%

Optics for the imaging x-ray polarimetry explorer

Ramsey

2022

J. Astron. Telesc. Instrum. Syst.

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Optimizing the electroforming process for full-shell X-ray optics

Singam,

Speegle,

Meekham

et al. 2024

J. Astron. Telesc. Instrum. Syst.

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Optimizing the electroforming process to enhance the thickness uniformity of full shell x-ray optics

Singam,

Speegle,

Meekham

et al. 2023

Optics for EUV, X-Ray, and Gamma-Ray Astronomy XI

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Electroforming replication technology at Marshall Space Flight Center has a long heritage of producing high-quality full-shell x-ray mirrors for various applications. Nickel alloys are electroformed onto a super-polished mandrel in the electroforming process, then separated to form the replicated full-shell optic. Various parameters in the electroplating configuration could result in the nonuniformity of the shell’s thickness. Thickness non-uniformities primarily occur due to non-uniform electric field distributions in the electroforming tank during the deposition. Using COMSOL Multiphysics simulations, we have studied the electric field distributions during the deposition process. Using these studies, we have optimized the electric fields inside the tank using customized shields and insulating gaskets on the mandrel. These efforts reduced thickness non-uniformity from over 20% to under 5% percent. Improving the thickness uniformity of the shell aids in better mounting and alignment of shells in the optics module. Optimization of the electroforming process, in some cases, improved the optical performance of the shells. COMSOL optimizing of the electroforming process and the experimental results validating these simulations are presented in this article.

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The Imaging X-Ray Polarimetry Explorer (IXPE): technical overview IV

Cited by 4 publications

References 4 publications

Optics for the imaging x-ray polarimetry explorer

Optics for the imaging x-ray polarimetry explorer

Optimizing the electroforming process for full-shell X-ray optics

Optimizing the electroforming process to enhance the thickness uniformity of full shell x-ray optics

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