The Hausdorff Voronoi Diagram of Polygonal Objects: A Divide and Conquer Approach

Papadopoulou, Evanthia; Lee, D. T.

doi:10.1142/s0218195904001536

Cited by 26 publications

(64 citation statements)

References 20 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…(G (A)) corresponds to the Hausdorff Voronoi diagram of all cuts on layer A. For information on Hausdorff Voronoi diagrams the interested reader is referred to [17,18,21,31]. After obtaining the experimental results of Section 7 using the provided guarantees of accuracy, we verified that small values of k are adequate for accurate critical area extraction.…”

Section: Original Implementationmentioning

confidence: 74%

Net-Aware Critical Area Extraction for Opens in VLSI Circuits Via Higher-Order Voronoi Diagrams

Papadopoulou

2011

IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Self Cite

View full text Add to dashboard Cite

We address the problem of computing critical area for open faults (opens) in a circuit layout in the presence of multilayer loops and redundant interconnects. The extraction of critical area is the main computational bottleneck in predicting the yield loss of a VLSI design due to random manufacturing defects. We first model the problem as a geometric graph problem and we solve it efficiently by exploiting its geometric nature. To model open faults we formulate a new geometric version of the classic min-cut problem in graphs, termed the geometric min-cut problem. Then the critical area extraction problem gets reduced to the construction of a generalized Voronoi diagram for open faults, based on concepts of higher order Voronoi diagrams. The approach expands the Voronoi critical area computation paradigm [5, 16-19, 22, 28] with the ability to accurately compute critical area for missing material defects even in the presence of loops and redundant interconnects spanning over multiple layers. The generalized Voronoi diagrams used in the solution are combinatorial structures of independent interest. Report Info Published June 2010Number USI-INF-TR-2010-6 Institution Faculty of Informatics Università della Svizzera italiana Lugano, SwitzerlandOnline Access www.inf.usi.ch/techreports IntroductionCatastrophic yield loss of integrated circuits is caused to a large extent by random particle defects interfering with the manufacturing process resulting in functional failures such as open or short circuits. Yield loss due to random manufacturing defects has been studied extensively in both industry and academia and several yield models for random defects have been proposed (see e.g., [8,25,26]). The focus of all models is the concept of critical area, a measure reflecting the sensitivity of a design to random defects during manufacturing. Reliable critical area extraction is essential for today's IC manufacturing especially when DFM (Design for Manufacturability) initiatives are under consideration. The critical area of a circuit layout on a layer A is defined aswhere A(r ) denotes the area in which the center of a defect of radius r must fall in order to cause a circuit failure and D(r ) is the density function of the defect size. The defect density function has been estimated as follows [8,12,25,29]:where p,q are real numbers (typically p = 3,q = 1), c = (q + 1)(p − 1)/(q + p ), and r 0 is some minimum optically resolvable size. Using typical values for p,q , and c , the widely used defect size distribution is derived, 1

show abstract

Section: Original Implementationmentioning

confidence: 74%

Net-Aware Critical Area Extraction for Opens in VLSI Circuits Via Higher-Order Voronoi Diagrams

Papadopoulou

2011

IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Self Cite

View full text Add to dashboard Cite

show abstract

“…Cheong et al [6] show that it can be computed in O(n log 3 n) time. The Hausdorff Voronoi Diagram (HVD) [7,11] subdivides the plane in a set of regions, with total complexity O(n). In each region, the same polygon is closest and the same feature of that polygon is furthest (see Fig.…”

Section: General Labelsmentioning

confidence: 99%

Circles in the Water: Towards Island Group Labeling

Goethem

Kreveld

Speckmann

2016

Geographic Information Science

View full text Add to dashboard Cite

Abstract. Many algorithmic results are known for automated label placement on maps. However, algorithms to compute labels for groups of features, such as island groups, are largely missing. In this paper we address this issue by presenting new, efficient algorithms for island label placement in various settings. We consider straight-line and circular-arc labels that may or may not overlap a given set of islands. We concentrate on computing the line or circle that minimizes the maximum distance to the islands, measured by the closest distance. We experimentally test whether the generated labels are reasonable for various real-world island groups, and compare different options. The results are positive and validate our geometric formalizations.

show abstract

“…[19]. Thus, it could be the case that if clusters can intersect but not cross the problem becomes polynomial-time solvable.…”

Section: Generalization To Non-crossing Clustersmentioning

confidence: 99%

New results on stabbing segments with a polygon

Díaz-Báñez

Korman

Pérez-Lantero

et al. 2015

Computational Geometry

View full text Add to dashboard Cite

Abstract. We consider a natural variation of the concept of stabbing a set of segments with a simple polygon: a segment s is stabbed by a simple polygon P if at least one endpoint of s is contained in P, and a segment set S is stabbed by P if P stabs every element of S. Given a segment set S, we study the problem of finding a simple polygon P stabbing S in a way that some measure of P (such as area or perimeter) is optimized. We show that if the elements of S are pairwise disjoint, the problem can be solved in polynomial time. (2010)] about finding a maximum perimeter convex hull for a set of imprecise points modeled as line segments. Our algorithm can also be extended to work for a more general problem, in which instead of segments, the set S consists of a collection of point sets with pairwise disjoint convex hulls. We also prove that for general segments our stabbing problem is NP-hard.

show abstract

The Hausdorff Voronoi Diagram of Polygonal Objects: A Divide and Conquer Approach

Cited by 26 publications

References 20 publications

Net-Aware Critical Area Extraction for Opens in VLSI Circuits Via Higher-Order Voronoi Diagrams

Net-Aware Critical Area Extraction for Opens in VLSI Circuits Via Higher-Order Voronoi Diagrams

Circles in the Water: Towards Island Group Labeling

New results on stabbing segments with a polygon

Contact Info

Product

Resources

About