The Hall Effect and its Applications

Stricker, S.

doi:10.1016/s0065-2539(08)60509-0

Cited by 3 publications

(1 citation statement)

References 34 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Šis metodas gali būti taikomas įvairių formų medžiagoms, tačiau jos turi turėti vienodą storį visame tiriamojo objekto perimetre ir būti izotropiškos bei homogeniškos. Metodas taip pat netinka ir mažo skersmens bandiniams (Stricker, 1968).…”

Section: Metalinių Laidininkų Elektrinio Laidumo Ir Savitosios Varžos...unclassified

Measurement of Electrical Conductivity and Resistivity of Cu-Nb18% Microcomposite Conductor and Its Welded Joint

Beinoras,

Višniakov

2024

Science - Future of Lithuania

View full text Add to dashboard Cite

Systems generating strong magnetic fields are widely used in modern fundamental and applied research as well as in the most innovative industrial processes. These devices generate magnetic fields that reach 5–100 T and the conductors are subjected to a huge Lorentz force, so the conductor material must be extremely strong (UTS ≥ 700 MPa) and have a good specific electrical conductivity (IACS ≥ 60%). Since traditional conductors such as copper, aluminum, gold, and silver cannot withstand such loads, microcomposite materials have been developed that are characterized by such high strength and good specific electrical conductivity. This paper reviews the specific electrical conductivity and specific electrical resistance characteristics of conductor and factors affecting them, methods of measuring these electrical characteristics as well as properties of Cu-Nb18% microcomposite conductor. This paper also describes the methodology for measuring the specific electrical conductivity and specific electrical resistance of the Cu-Nb18% microcomposite conductor solid and with welded joint (welded by using butt welding). The comparison of application possibilities of used methodologies and obtained characteristics was carried out.

show abstract

Section: Metalinių Laidininkų Elektrinio Laidumo Ir Savitosios Varžos...unclassified

Measurement of Electrical Conductivity and Resistivity of Cu-Nb18% Microcomposite Conductor and Its Welded Joint

Beinoras,

Višniakov

2024

Science - Future of Lithuania

View full text Add to dashboard Cite

show abstract

De-carbonization of self-assembled molecular monolayers doping in silicon

Chang

Zhang

et al. 2022

AIP Advances

View full text Add to dashboard Cite

Unintentional C-related contamination can be readily introduced into the substrate in self-assembled molecular monolayer doping. These C contaminants can bind with dopants, forming interstitial defects, which will in return electrically deactivate the dopants. This issue will exacerbate when the dopant concentration is low. In this paper, a low temperature oxidation method (550 °C for 30 min) is introduced to remove carbon before the phosphorus dopants are driven into silicon in a rapid thermal annealing process. The samples with and without the pre-oxidation process are characterized by the Van der Pauw, low-temperature Hall effect measurements, and secondary ion mass spectrometry analysis. The results indicate that the surface carbon concentration in silicon is nearly completely removed with the pre-oxidation process, as a result of which the electrical activity of phosphorus is indeed increased.

show abstract