“…X-ray spectra obtained from the PIXE measurements were analyzed with GUPIX software developed by Guelph University (Maxwell et al, 1989(Maxwell et al, , 1995. Concentration of the following twenty elements were measured and analyzed for each sample: Al, As, Br, Ca, Cl, Cr, Cu, Fe, K, Mg, Mn, Na, Ni, P, Pb, S, Si, Ti, V and Zn.…”