“…All measurements were carried out using a model contrAA 300 high resolution continuum source ame atomic absorption spectrometer (Analytik Jena, Jena, Germany), whose instrumental details are summarized by Welz et al 2 The experimental setup is identical to that in ref. 18. MA data of AlF at a wavelength of 227.66 nm, of SiO at a wavelength of 229.90 nm and of BF at a wavelength of 195.59 nm, as well as AA data of Al at a wavelength of 256.798 nm, B at a wavelength of 249.77 nm and Si at a wavelength of 251.61 nm were obtained by means of a reference spectrum to correct unwanted ame structures by static (AlF, BF, and SiO) or dynamic (Al, B, and Si) background correction with reference measurements.…”