The First Fifty Years of Atom Probe

Kelly, Thomas F.; Panitz, J. A.

doi:10.1017/s155192951700044x

Cited by 4 publications

(2 citation statements)

References 32 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Originally developed as an atomic‐scale point‐sampling method (Müller et al ), over several decades the technology and methodology surrounding this field has gradually improved and matured to a more versatile analytical approach that can be applied to a range of materials across various research disciplines and industrial applications (Kelly and Panitz ). APT is used within materials science and semiconductor manufacturing to visualise and quantify chemical variations at sub‐micrometre scales (Figure ).…”

Section: An Introduction To Atom Probe Tomographymentioning

confidence: 99%

Atom Probe Tomography: Development and Application to the Geosciences

Reddy

Saxey

Rickard

et al. 2020

Geostandard Geoanalytic Res

102

View full text Add to dashboard Cite

Atom probe tomography (APT) is an analytical technique that provides quantitative three‐dimensional elemental and isotopic analyses at sub‐nanometre resolution across the whole periodic table. Although developed and mostly used in the materials science and semiconductor fields, recent years have seen increasing development and application in the geoscience and planetary science disciplines. Atom probe studies demonstrate compositional complexity at the nanoscale and provide fundamental new insights into the atom‐scale mechanisms taking place in minerals over geological time. Here, we provide an overview of APT, including the historical development and technical aspects of the instrumentation, and the fundamentals of data acquisition, data processing and data reconstruction. We also review previous studies and highlight the potential future applications of nanoscale geochemical studies of natural materials.

show abstract

Section: An Introduction To Atom Probe Tomographymentioning

confidence: 99%

Atom Probe Tomography: Development and Application to the Geosciences

Reddy

Saxey

Rickard

et al. 2020

Geostandard Geoanalytic Res

102

View full text Add to dashboard Cite

show abstract

“…The former was first introduced by Jinnai et al in the mid-1990s, to resolve the morphology of bicontinuous polymer mixtures, − and the latter has been reported in imaging fiber-reinforced or porous polymers. , While both imaging techniques allow 3D visualization, their spatial resolutions are traditionally limited to micrometer-scale with the recent innovation of pushing it to 7 nm in resolving NP lattices and multimaterial frameworks, still far below that of electron beam-based methods (0.1–0.3 nm for TEM and 0.5–1 nm for SEM) . On the other hand, field ion microscopy was introduced in 1951, which resolved individual atoms in 1955, evolved into a 3D imaging technique called atom probe tomography (APT) in 1980s. − While APT offers a high resolution below 0.15 nm on composition, it has a few drawbacks; the most prominent one is that APT is a destructive technique. − Apart from consuming the specimen during analysis, APT also has limited sample size and requires special sample preparation methods such as FIB-milling and chemical fixation, which may interact with samples and introduce unwanted artifacts …”

Section: Electron Tomography Of the 3d Structure Morphology And Compo...mentioning

confidence: 99%

Electron Microscopy Studies of Soft Nanomaterials

et al. 2023

View full text Add to dashboard Cite

This review highlights recent efforts on applying electron microscopy (EM) to soft (including biological) nanomaterials. We will show how developments of both the hardware and software of EM have enabled new insights into the formation, assembly, and functioning (e.g., energy conversion and storage, phonon/photon modulation) of these materials by providing shape, size, phase, structural, and chemical information at the nanometer or higher spatial resolution. Specifically, we first discuss standard real-space two-dimensional imaging and analytical techniques which are offered conveniently by microscopes without special holders or advanced beam technology. The discussion is then extended to recent advancements, including visualizing three-dimensional morphology of soft nanomaterials using electron tomography and its variations, identifying local structure and strain by electron diffraction, and recording motions and transformation by in situ EM. On these advancements, we cover state-of-the-art technologies designed for overcoming the technical barriers for EM to characterize soft materials as well as representative application examples. The even more recent integration of machine learning and its impacts on EM are also discussed in detail. With our perspectives of future opportunities offered at the end, we expect this review to inspire and stimulate more efforts in developing and utilizing EM-based characterization methods for soft nanomaterials at the atomic to nanometer length scales in academic research and industrial applications.

show abstract

Effect of crystallographic orientation on atom probe tomography geochemical data?

Cappelli

Pérez‐Huerta

2020

Micron

View full text Add to dashboard Cite

The First Fifty Years of Atom Probe

Cited by 4 publications

References 32 publications

Atom Probe Tomography: Development and Application to the Geosciences

Atom Probe Tomography: Development and Application to the Geosciences

Electron Microscopy Studies of Soft Nanomaterials

Effect of crystallographic orientation on atom probe tomography geochemical data?

Contact Info

Product

Resources

About