Abstract:We present a new formulation of the Finite Element Method (FEM) dedicated to the 2D rigorous solving of Maxwell equations adapted to the calculation of the diffracted field in optoelectronic subwavelength structures. The advantage of this method is that its implementation remains independent of the number of layers in the structure, of the number of diffractive patterns, of the geometry of the diffractive object and of the properties of the materials.The spectral response of large test photodiodes that can leg… Show more
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