Abstract:Triple‐axis X‐ray diffractometry was used to study diffuse scattering from an AlAs/GaAs superlattice grown on an [001]‐oriented GaAs substrate by molecular beam epitaxy. Reciprocal‐space maps were obtained around the 002 reflection from the superlattice and its low‐angle first‐order satellite. The data obtained reveal quasi‐Bragg diffuse‐scattering sheets caused by conformal behavior of interfacial roughness as well as amplification of diffuse scattering when the incoming or outgoing angle is nearly equal to t… Show more
“…Nevertheless, in the experiment we have repeatedly observed the violation of the reciprocity principle [3][4][5]. The main reason of this violation can be well illustrated by the following.…”
mentioning
confidence: 69%
“…[5], we have studied the diffuse scattering from an AlAs/GaAs superlattice near the wideangle Bragg reflection and its satellite. One of the important purposes of this study was to compare these data with the diffuse scattering near the small-angle Bragg reflections.…”
“…Nevertheless, in the experiment we have repeatedly observed the violation of the reciprocity principle [3][4][5]. The main reason of this violation can be well illustrated by the following.…”
mentioning
confidence: 69%
“…[5], we have studied the diffuse scattering from an AlAs/GaAs superlattice near the wideangle Bragg reflection and its satellite. One of the important purposes of this study was to compare these data with the diffuse scattering near the small-angle Bragg reflections.…”