The electron energy loss spectra of some alkali halides in the band gap region

Roy, G.; Singh, Gagandeep; Gallon, T E

doi:10.1016/0039-6028(85)90519-9

Cited by 76 publications

(16 citation statements)

References 13 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The first ͑A͒ corresponds to the exciton state in the band gap whereas the sec- ond ͑B͒ is the threshold for excitation over the band gap. This result is consistent with measurements of the electron energy loss spectrum of a LiF film with conventional electrostatic analyzers, 13,16 where broad maxima at 10.4 eV and 13.5 eV are observed.…”

Section: Low-energy Secondary-electron Emission From Lif Filmssupporting

confidence: 90%

Highly efficient time-of-flight spectrometer for studying low-energy secondary emission from dielectrics: Secondary-electron emission from LiF film

Samarin

Artamonov

Waterhouse

et al. 2003

Review of Scientific Instruments

View full text Add to dashboard Cite

Articles you may be interested inA simple electron time-of-flight spectrometer for ultrafast vacuum ultraviolet photoelectron spectroscopy of liquid solutions Rev. Sci. Instrum. 85, 103117 (2014); 10.1063/1.4899062 Determining time resolution of microchannel plate detectors for electron time-of-flight spectrometers Rev. Sci. Instrum. 81, 073112 (2010); 10.1063/1.3463690 Angle-resolving time-of-flight electron spectrometer for near-threshold precision measurements of differential cross sections of electron-impact excitation of atoms and molecules Rev. Sci. Instrum. 79, 043105 (2008); 10.1063/1.2912824 High resolution time-of-flight spectrometer for crossed molecular beam study of elementary chemical reactions Rev. Sci. Instrum. 76, 083107 (2005); 10.1063/1.1960718High resolution pulsed field ionization photoelectron spectroscopy using multibunch synchrotron radiation: Timeof-flight selection scheme Rev.A highly efficient time-of-flight electron spectrometer is described. An incident electron current of the order of 10 Ϫ14 A makes it suitable for studying secondary emission from dielectric surfaces. A microchannel plate position-sensitive detector allows flight distance correction while keeping a large acceptance angle. Measured energy distribution curves of secondary electrons generated from a LiF film by 19-31 eV incident electrons demonstrate good energy resolution and reveal reproducible and stable emission features at 2.6Ϯ0.3 eV, 7.2Ϯ0.3 eV, and 10.3Ϯ0.3 eV.

show abstract

Section: Low-energy Secondary-electron Emission From Lif Filmssupporting

confidence: 90%

Highly efficient time-of-flight spectrometer for studying low-energy secondary emission from dielectrics: Secondary-electron emission from LiF film

Samarin

Artamonov

Waterhouse

et al. 2003

Review of Scientific Instruments

View full text Add to dashboard Cite

show abstract

“…On this basis, the optical and fundamental energy gaps for MgO amount to about 6.21 eV 82 and 7.8 eV, 83 while in the case of LiF the optical and fundamental energy gaps are 11.6 eV 84 and 13.7 eV. 85,86…”

Section: Experimental Energy Gaps Of the Semiconductor Test Setmentioning

confidence: 98%

Accurate Band Gap Predictions of Semiconductors in the Framework of the Similarity Transformed Equation of Motion Coupled Cluster Theory

et al. 2019

View full text Add to dashboard Cite

In this work, we present a detailed comparison between wave-function-based and particle/hole techniques for the prediction of band gap energies of semiconductors. We focus on the comparison of the back-transformed Pair Natural Orbital Similarity Transformed Equation of Motion Coupled-Cluster (bt-PNO-STEOM-CCSD) method with Time Dependent Density Functional Theory (TD-DFT) and Delta Self Consistent Field/DFT (Δ-SCF/DFT) that are employed to calculate the band gap energies in a test set of organic and inorganic semiconductors. Throughout, we have used cluster models for the calculations that were calibrated by comparing the results of the cluster calculations to periodic DFT calculations with the same functional. These calibrations were run with cluster models of increasing size until the results agreed closely with the periodic calculation. It is demonstrated that bt-PNO-STEOM-CC yields accurate results that are in better than 0.2 eV agreement with the experiment. This holds for both organic and inorganic semiconductors. The efficiency of the employed computational protocols is thoroughly discussed. Overall, we believe that this study is an important contribution that can aid future developments and applications of excited state coupled cluster methods in the field of solid-state chemistry and heterogeneous catalysis.

show abstract

“…Due to the fordidden band gap in the alkali halide target, the first channel is effectively blocked, with possible exception of very loosely bound levels that are resonant with higher lying empty surface states [18,17].…”

Section: Experimental Approachmentioning

confidence: 99%

On the neutralization of singly and multicharged projectiles during grazing interactions with LiF(100)

Meyer

Yan

Emmichoven

et al. 1997

Nuclear Instruments and Methods in Physics Research Section B:

View full text Add to dashboard Cite

Measurements are reported of scattered neutral fractions for Na, K, Cs, and Ne singly and multicharged ions, and of scattered negative ion fractions for incident 0, F, and B projectiles grazingly incident on LiF( 100) as function of projectile velocity. In the case of the Na and Ne incident ions, signifi-.cant dependence of the scattered neutral fractions on incident charge state is found, which is most pronounced at the lowest investigated velocities. Possible reasons for the observed initial charge state dependence are considered.In addition, results are reported for the target azimuthal dependence of the find neutral fraction observed for grazingly incident 35 keV C S +~ ions.

show abstract

The electron energy loss spectra of some alkali halides in the band gap region

Cited by 76 publications

References 13 publications

Highly efficient time-of-flight spectrometer for studying low-energy secondary emission from dielectrics: Secondary-electron emission from LiF film

Highly efficient time-of-flight spectrometer for studying low-energy secondary emission from dielectrics: Secondary-electron emission from LiF film

Accurate Band Gap Predictions of Semiconductors in the Framework of the Similarity Transformed Equation of Motion Coupled Cluster Theory

On the neutralization of singly and multicharged projectiles during grazing interactions with LiF(100)

Contact Info

Product

Resources

About