The effects of surface topography in nuclear microprobe Rutherford backscattering analysis

Hobbs, C.P.; McMillan, J.W.; Palmer, D.W.

doi:10.1016/0168-583x(88)90023-7

Cited by 26 publications

(4 citation statements)

References 8 publications

Supporting

Mentioning

Contrasting

Unclassified

Order By: Relevance

“…Finally, several papers have been dedicated to developing code that can be of general use for analysing samples with surface roughness of some tens or hundreds of nanometres, but normally on the few micrometre scale [8][9][10][11][12][13][14], for both RBS and elastic recoil detection analysis (ERDA). While the older codes tend to make some severe approximations (such as considering only single-elemental, mono-isotopic targets), some of the more recent ones can be very sophisticated and reproduce experimental data very well.…”

Section: Introductionmentioning

confidence: 99%

Rutherford backscattering analysis of thin films and superlattices with roughness

Barradas

2001

J. Phys. D: Appl. Phys.

View full text Add to dashboard Cite

Knowledge on the thickness, composition, and interfaces of thin films and multilayers is, in many systems, fundamental for the understanding and optimization of their properties. One of the techniques often applied to such studies is Rutherford backscattering (RBS). However, it has been very difficult to account for the effects of interface roughness in the data obtained, and the alternative has been to develop dedicated data analysis codes for particular problems where roughness plays a determinant role. In this work, the effect of roughness is taken into account in the data analysis by calculating the effect of roughness on the apparent energy resolution as a function of depth. This depends on the exact type of roughness, and three different models have been implemented: inhomogeneous layer thickness, corrugated sample, and rough substrate surface. Interfacial mixing in multilayers can also be analysed with the method developed. Automatic fits to the data can be performed in this way, where the roughness parameters are derived during the fit, providing a new tool for RBS analysis. The code is applied to several systems in order to test its validity and applicability. Systems which are hard to analyse by RBS have been chosen: Si/VS/Si 0.65 Ge 0.35 300 nm/Si 0.2 Ge 0.8 4 nm/Si 0.65 Ge 0.35 15 nm/Si 3 nm thin films, where VS stands for a linearly composition-graded virtual substrate; and MgO/(Fe 25 Å/Co 20 Å) 10 multilayers.

show abstract

Section: Introductionmentioning

confidence: 99%

Rutherford backscattering analysis of thin films and superlattices with roughness

Barradas

2001

J. Phys. D: Appl. Phys.

View full text Add to dashboard Cite

show abstract

“…Adhärente Biofilme auf kieferorthopädischen Werkstoffen lassen sich unter Anwendung von rasterelektronenmikroskopischen Aufnahmetechniken darstellen. Insbesondere die Rutherford-Backscattering-Detection (RBSD)-Methode ist zur Darstellung und nachgelagerten computergestützten Quantifizierung geeignet [20]. Bei dieser Aufnahmetechnik wird, wie auch bei der Secondary-Electron (SE)-Abbildung, die zu untersuchende Probe mit einem fokussierten Primärelektronenstrahl abgerastert.…”

Section: Materials Und Methoden Ergebnisseunclassified

Analyse der Biofilmbildung auf kieferorthopädischen Apparaturen

Demling¹,

Heuer²,

Dittmer³

et al. 2014

ZWR

View full text Add to dashboard Cite

Intraorale Biofilme auf kieferorthop?dischen Apparaturen stellen eine Gefahr f?r die strukturelle Integrit?t der Hart- und Weichgewebe dar. Die Identifikation oraler Biofilme kann chemisch mittels der energiedispersiven R?ntgenanalyse (EDX) und morphologisch mithilfe der Rasterelektronenmikroskopie wie der hochaufl?senden Sekund?relektronenmikroskopie (SE) und der Rutherford-Backscattering-Detection (RBSD)-Methode erfolgen. Unter Anwendung der beschriebenen Methodik lassen sich Pr?dilektionsstellen der Biofilmakkumulation unter Realbedingungen identifizieren und daraus notwendige Ma?nahmen zur Oberfl?chenfunktionalisierung oder Gestaltoptimierung ableiten.

show abstract

“…Rutherford backscattering spectrometry is a technique used for structural and compositional characterization of thin films [40]. A mono-energetic beam of α-particles (4He 2+ ) is generated by an accelerator, and directed towards the sample via bending magnets.…”

Section: Rutherford Backscattering Spectrometrymentioning

confidence: 99%

Oxide thin films as bioactive coatings

Khokhlova

Dykas

Krishnan-Kutty

et al. 2018

J. Phys.: Condens. Matter

View full text Add to dashboard Cite

Growth and survival of biological cells (eukaryotes and prokaryotes) on artificial environments often depend on their interactions with the specific surface. Various organic materials can be coated on substrates to assist cells' adhesion and other subsequent cellular processes. However, these coatings are expensive, degrade over short time period, and may even interfere with the cells' signaling processes. Therefore, the use of inorganic surfaces in order to control cellular interactions is of scientific importance from fundamental and application perspectives. Among inorganic materials, oxide thin films have received considerable attention. Thin films of oxides have the advantage of tailoring the surfaces for cellular interactions while using a negligible amount of the oxide material. Here, we review the lesser known application of inorganic oxide coatings as biocompatible and implantable platforms for different purposes, such as biofilm inhibition, cell culture and implant enhancements.

show abstract

The effects of surface topography in nuclear microprobe Rutherford backscattering analysis

Cited by 26 publications

References 8 publications

Rutherford backscattering analysis of thin films and superlattices with roughness

Rutherford backscattering analysis of thin films and superlattices with roughness

Analyse der Biofilmbildung auf kieferorthopädischen Apparaturen

Oxide thin films as bioactive coatings

Contact Info

Product

Resources

About