1996
DOI: 10.1088/0953-2048/9/11/003
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The effective surface resistance of superconductor/dielectric/metal structures

Abstract: We investigate the effective microwave surface resistance of superconductor/dielectric/normal metal structures through numerical simulations. In particular, the setup with a thin superconducting film on a dielectric substrate, backed by a metallic endplate, is analysed. The results demonstrate that the effects of the substrate on the measured surface resistance of superconducting thin films must be taken into account. We show that in this setup several spurious effects are predicted. At characteristic frequenc… Show more

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Cited by 73 publications
(54 citation statements)
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“…The field induced change in the intrinsic thin film impedance, ∆R ′ s + i∆X ′ s = (∆ρ 1 + i∆ρ 2 )/d, was measured for T > 60 K and µ 0 H < 0.8 T by means of a sapphire dielectric resonator operating in the TE 011 mode at 47.7 GHz. 10 The STO substrate resonances 11,12 were removed with the introduction of an additional spacer to change the substrate impedance. 13 Here, ρ 1 + iρ 2 is the complex resistivity of the film.…”
mentioning
confidence: 99%
“…The field induced change in the intrinsic thin film impedance, ∆R ′ s + i∆X ′ s = (∆ρ 1 + i∆ρ 2 )/d, was measured for T > 60 K and µ 0 H < 0.8 T by means of a sapphire dielectric resonator operating in the TE 011 mode at 47.7 GHz. 10 The STO substrate resonances 11,12 were removed with the introduction of an additional spacer to change the substrate impedance. 13 Here, ρ 1 + iρ 2 is the complex resistivity of the film.…”
mentioning
confidence: 99%
“…A moderate magnetic field, aligned with the c axis, is swept at each temperature from 0 to Bxm 0 HZ0.8 T (we expect that the approximate equality between applied and internal field can be inaccurate at very low fields only). In the temperature range here explored, TO70 K, the thin-film approximation is justified [10] and measurements of the field-induced shifts of Q factor and n 0 yield the field-induced variations of the complex resistivity, DrðBÞ, at fixed temperatures. The determination of DrðBÞ requires only the knowledge of geometrical factors; absolute values ofr require the cavity calibration.…”
Section: Methodsmentioning
confidence: 96%
“…In Equation (1) G is a calculated geometrical factor, d is the film thickness, B µ 0 H is the flux density, and we have made use of the thin-film expression [17]. Complications arising from the strong temperature dependence of the substrate permittivity were dealt with according to the method described in [18].…”
Section: Methodsmentioning
confidence: 99%