The effect of surface roughness on XPS and AES

Bernárdez, L.S. De; Ferrón, J.; Goldberg, E. C.; Buitrago‐Sierra, Robison

doi:10.1016/0039-6028(84)90068-2

Cited by 38 publications

(8 citation statements)

References 11 publications

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“…This is expected because angle resolved XPS is a good method to study the nanoscale surface composition and structure of the flat surfaces; however, it gives very complex results for rough surfaces. According to De Bernardez et al,49 the complexity of the XPS results on rough surfaces is due to two competitive mechanisms: (i) the shadowing effect of the neighboring clusters, which is the main effect and (ii) the electron emission from a tilted surface. Therefore, the XPS peak intensities are no straightforward for interpretation in case of rough substrates.…”

Section: Resultsmentioning

confidence: 99%

Combined XPS and contact angle studies of flat and rough ethylene‐vinyl acetate copolymer films

Doğancı¹,

Cansoy²,

Ucar³

et al. 2011

J of Applied Polymer Sci

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Flat and rough thin films were prepared by dip coating using LDPE, PVAc, and EVA polymers containing 12-40% VA contents. Surface free energy of flat films was determined by measuring contact angles. Surface atomic composition was investigated by XPS at 0 and 60 take-off angles. XPS results show that hydrophobic PE component was found to enrich at the near-surface region for all EVA samples for a depth of $ 5 nm for both flat and rough surfaces, whereas hydrophilic VA component was enriched on the surface when VA < 18% for only at 10 nm depth. The difference between the XPS results of the flat and rough surfaces was not significant for EVA samples except EVA-33 surface where the atomic oxygen content decreased 15-20% for rough surfaces. Contact angle hysteresis values for the rough samples were much larger than that of the flat samples for LDPE and EVA-12 surfaces due to the presence of partial trapping of air pockets on these rough surfaces. A good agreement was obtained between surface concentration of atomic oxygen in the 5 nm outermost layer and c À S surface free energy component especially for the samples having high VA contents.

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Section: Resultsmentioning

confidence: 99%

Combined XPS and contact angle studies of flat and rough ethylene‐vinyl acetate copolymer films

Doğancı¹,

Cansoy²,

Ucar³

et al. 2011

J of Applied Polymer Sci

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“…We are aware that sensu stricto XPS analysis (like CA analysis) requires smooth homogeneous surfaces as surface roughness can affect the intensity of the XPS signal 49 50 . As an estimate for the influence of surface roughness the full width at half maximum (FWHM) of the Si 2p PE was used.…”

Section: Methodsmentioning

confidence: 99%

Soil wettability can be explained by the chemical composition of particle interfaces - An XPS study

Woche

Goebel

Mikutta

et al. 2017

Sci Rep

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Soil wettability (quantified in terms of contact angle, CA) is crucial for physical, chemical, and biological soil functioning. As the CA is determined by components present within the outmost nanometer of particles, this study applied X-ray photoelectron spectroscopy (XPS) with a maximum analysis depth of 10 nm to test the relationship between CA and surface elemental composition, using soil samples from a chronosequence where CA increased from 0° (0 yrs) to about 98° (120 yrs). Concurrently, as seen by XPS, C and N content increased and the content of O and the mineral-derived cations (Si, Al, K, Na, Ca, Mg, Fe) decreased. The C content was positively correlated with CA and least squares fitting indicated increasing amounts of non-polar C species with soil age. The contents of O and the mineral-derived cations were negatively correlated with CA, suggesting an increasing organic coating of the minerals that progressively masked the underlying mineral phase. The atomic O/C ratio was found to show a close negative relationship with CA, which applied as well to further sample sets of different texture and origin. This suggests the surface O/C ratio to be a general parameter linking surface wettability and surface elemental composition.

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“…Since it is more pronounced in the more surface sensitive 395 eV measurements, we infer that it is caused by the change in surface texture induced by etching (as discussed below) which may alter the sensitivity factors for photoelectrons generated from subsurface carbon. In particular, increased roughness results in a lower signal due to a broadening of the angular distribution of photoelectrons [31].…”

Section: A Xps C(1s)mentioning

confidence: 99%

Nanostructuring and oxidation of diamond by two-photon ultraviolet surface excitation: An XPS and NEXAFS study

et al. 2014

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We report C(1s) and O(1s) surface sensitive x-ray photoelectron spectroscopy (XPS) and C and O K-edge partial-electron yield near-edge x-ray absorption fine structure (NEXAFS) measurements for (100) and (110) oxidized diamond surfaces, etched by a laser two-photon ultraviolet (UV) desorption process. Etched regions of the (100) surface show increased oxygen coverage with a higher fraction of singly bonded termination species than unetched regions. Similar changes are observed for the (110) but with smaller magnitude. For both surfaces, no major change in sp 2 bonded carbon is observed. We show that the terminations observed for etched surfaces are consistent with the formation of oxidized {111} facets. For deeply etched samples, atomic force microscopy and scanning electron microscopy confirm the presence of {111}-like facets and reveals the development of nanoscale facetted ridges directed perpendicular to the etching beam polarization. An etching mechanism is proposed involving localized optical absorption by surface electronic states, with the probability for subsequent desorption events varying according to the relative directions of laser polarization and lattice orientation.

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The effect of surface roughness on XPS and AES

Cited by 38 publications

References 11 publications

Combined XPS and contact angle studies of flat and rough ethylene‐vinyl acetate copolymer films

Combined XPS and contact angle studies of flat and rough ethylene‐vinyl acetate copolymer films

Soil wettability can be explained by the chemical composition of particle interfaces - An XPS study

Nanostructuring and oxidation of diamond by two-photon ultraviolet surface excitation: An XPS and NEXAFS study

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