2013
DOI: 10.1557/jmr.2013.143
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The effect of substrate pore size on the network interconnectivity and electrical properties of dropcasted multiwalled carbon nanotube thin films

Abstract: Four-layer multiwalled carbon nanotube (MWNT) thin films were deposited via dropcasting (1 mg/mL MWNTs and 10 mg/mL SDBS) onto filter papers that vary in pore size (1, 5, 25, and 40 lm) to determine the effect of the underlying substrate structure on the in-plane properties of the films. The films (,100 nm thick) were dried using vacuum filtration, and drying in a 65°C heater with and without a ceramic heating board. DC resistance of the films ranged from 6 Â 10 3 to 9.3 Â 10 9 X. Impedance spectroscopy anal… Show more

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Cited by 11 publications
(13 citation statements)
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References 25 publications
(29 reference statements)
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“…First, there is a high frequency parallel R-C (R 1 -C 1 ), which describes MWNT bundle behavior. The resistance of the bundles (R 1 5 ;900 X) matches those reported in a previous publication, 20 which is expected since the same type of MWNT was used in this experiment. The low frequency parallel R-C (R 2 -C 2 ) describes the MWNT-MWNT junction behavior.…”
Section: Resultssupporting
confidence: 84%
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“…First, there is a high frequency parallel R-C (R 1 -C 1 ), which describes MWNT bundle behavior. The resistance of the bundles (R 1 5 ;900 X) matches those reported in a previous publication, 20 which is expected since the same type of MWNT was used in this experiment. The low frequency parallel R-C (R 2 -C 2 ) describes the MWNT-MWNT junction behavior.…”
Section: Resultssupporting
confidence: 84%
“…Weight (%) and heat flow (W/g) versus temperatures graphs were analyzed for weight loss events. Figure 2 displays the low frequency resistance for the in-plane measurements for all of the films fabricated and characterized as a function of the number of layers deposited (this is equivalent to DC resistance as described before 20 ). It is clear that the films made from the CB dispersion never achieve a fully interconnected state as they remain highly resistive even after 20 deposition layers.…”
Section: Characterization Techniquesmentioning
confidence: 99%
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