2019
DOI: 10.1016/j.diamond.2019.03.004
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The effect of oxygen on the N2 photofixation ability over N vacancies embedded g-C3N4 prepared by dielectric barrier discharge plasma treatment

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Cited by 18 publications
(13 citation statements)
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“…For instance, Zhao et al employed dielectric barrier discharge plasma treatment to prepared N vacancies embedded g-C 3 N 4 (Nv-CN). 86 In the atmosphere of 50% N 2 and 50% O 2 , the nitrogen xation rate reaches 5.5 mg L À1 h À1 g cat À1 under visible light.…”
Section: Oxygen Vacancymentioning
confidence: 95%
“…For instance, Zhao et al employed dielectric barrier discharge plasma treatment to prepared N vacancies embedded g-C 3 N 4 (Nv-CN). 86 In the atmosphere of 50% N 2 and 50% O 2 , the nitrogen xation rate reaches 5.5 mg L À1 h À1 g cat À1 under visible light.…”
Section: Oxygen Vacancymentioning
confidence: 95%
“…The plasma treatment of bulk g-C 3 N 4 synthesized by urea pyrolysis led to the formation of nitrogen vacancies. The latter did not change the structure, specific surface area, and morphology of the photocatalyst but affected significantly the efficiency of nitrogen photo-fixation in methanol as a hole acceptor [84]. It was found that the NH 4 + formation rate involving V N -g-C 3 N 4 composite was higher in a mixture of 50% of N 2 and 50% of O 2 (2.75 mg/h×g PC ) than in pure nitrogen (1.3 mg/h×g PC ) (Table 1).…”
Section: Bulk and Modified Graphite-like Carbon Nitridementioning
confidence: 87%
“…In their work, a N decient g-C 3 N 4 catalyst was prepared by the dielectric barrier discharge plasma treatment method, which displayed a NH 3 production rate of 161.8 mmol g À1 h À1 . 41 Mechanism exploration disclosed that N 2 was activated via the two-path analogous Mar-van Krevelen mechanism. 41 Oxygen vacancies on oxide semiconductors are active centers for N 2 adsorption and capable of activating N 2 .…”
Section: Semiconductors As Photocatalysts For Pnfmentioning
confidence: 99%