Abstract:Keeping deposition temperature and oxygen pressure constant at 300°C and 4.0×10-2Pa, respectively, deposition of ZnO thin films with c-axis oriented (002) hexagonal wurtzite crystal structure was achieved by pulsed filtered cathodic vacuum arc deposition (PFCVAD) system at various negative substrate bias on Si(100). The surface morphology was characterized using AFM, and crystallographic structure was studied by means of X-ray diffraction. Based on the biaxial strain model, Strain properties of the ZnO films w… Show more
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