In this paper, the gain G T of a microwave transistor is expressed analytically in terms of the mismatchings (V in ≥ 1, V out ≥ 1) at the ports, noise figure F ≥ F min and the [z]-parameter and noise parameters. Firstly, because the input termination Z S determines the noise F ≥ F min , thus the input termination Z S is pre-determined to lie on the tangent constant noise and available gain circles so that the maximum power delivery is ensured for the given noise. Then, a design configuration is constructed in the input impedance Z in -plane covering the gain and the required input and output mismatch circles within the Unconditionally Stable Working Area for the predetermined input termination Z S . Finally, the compatible (F ≥ F min , G T , V in ≥ 1, V out ≥ 1) quadrates for either required or optimum (V in ≥ 1, V out ≥ 1) couples are obtained with their (Z S , Z L ) couples from the analysis of the design configuration. Furthermore, a case study is also presented for the full flexible performance characterization of a selected microwave transistor. It can be concluded that the near future microwave transistor is expected to be identified by performance data base built by its compatible (F ≥ F min , G T , V in ≥ 1, V out ≥ 1) quadrates and the (Z S , Z L ) terminations within the device operation domain to overview all the possible low-noise amplifier designs using the full device capacity. produce high technology transistor, which is, of course, a matter of the semiconductor technology. However, the second stage is to be able to utilize the full capacity of the high technology device that necessitates to analyze the potential performance of the device based on the linear circuit and noise theories and construct the trade-off relations simultaneously among the noise, gain, mismatch losses, bias condition V DS , I DS , and operation frequency f. Thus, a feasible design target space can be built subject to the potential performance of the active device to overview all possible designs using the full capacity of the device. Otherwise, the design targets will generally either fail to be satisfied or allow working the circuit under the potential performance of the device.However, today's conventional LNA design flow consists of trading-off based on the designer's experience and intuition among the often contrasting goals of low noise, high gain, and input and output matches in either iterative or non-iterative approach; none of which are not based on the full capacity of the device. Furthermore, series or shunt feedback is assessed to ease the noise/gain trade-off at the LNA's input, by bringing closer, in the source reflection coefficient plane, the optimum noise (Г opt ) and the maximum gain terminations at the device's input port [7][8][9][10][11][12].A different design approach that consists of evaluating the noise/gain trade-off at the transistor level is introduced by Haus and Adler [13], with a new term 'noise measure (M)' tying the two key performance components of the amplifier, then this methodology is subs...