The effect of atomic dynamics on the energy loss of ions channeled in carbon nanotubes

Lysova, I. V.; Sabirov, A. S.; Степанов, А. В.

doi:10.1134/s1027451010020278

Cited by 8 publications

(2 citation statements)

References 4 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The extremely small, essentially nonexistant, C signal in the RBS spectrum of the CNT forest suggesting a form of ‘channeling’ of the ions through the CNT forest. This phenomenon does not appear to have been previously reported, although it has been suggested that the interiors of CNTs could be used as ion guides The odd–even effect for the ToF‐SIMS C n ‐ peaks for n = 1 … 6 and the steady decrease in intensity for the n ≥ 6 peaks.…”

Section: Discussionmentioning

confidence: 53%

Multi‐instrument characterization of the surfaces and materials in microfabricated, carbon nanotube‐templated thin layer chromatography plates. An analogy to ‘The Blind Men and the Elephant’

Jensen

Kanyal

Madaan

et al. 2013

Surface & Interface Analysis

View full text Add to dashboard Cite

We apply a suite of analytical tools to characterize materials created in the production of microfabricated thin layer chromatography plates. Techniques used include X-ray photoelectron spectroscopy (XPS), valence band spectroscopy, time-of-flight secondary ion mass spectrometry (ToF-SIMS) in both positive and negative ion modes, Rutherford backscattering spectroscopy (RBS), and helium ion microscopy. Materials characterized include: the Si(100) substrate with native oxide: Si/SiO 2 , alumina (35 nm) deposited as a diffusion barrier on the Si/SiO 2 : Si/SiO 2 /Al 2 O 3 , iron (6 nm) thermally evaporated on the Al 2 O 3 : Si/SiO 2 /Al 2 O 3 /Fe, the iron film annealed in H 2 to make Fe catalyst nanoparticles: Si/SiO 2 /Al 2 O 3 /Fe(NP), and carbon nanotubes (CNTs) grown from the Fe nanoparticles: Si/SiO 2 /Al 2 O 3 /Fe(NP)/CNT. The Fe films and nanoparticles appear in an oxidized state. Some of the analyses of the CNTs/CNT forests appear to be unique: (i) the CNT forest appears to exhibit an interesting 'channeling' phenomenon by RBS, (ii) we observe an odd-even effect in the SIMS spectra of C n -species for n = 1 -6, with the n ≥ 6 ions showing a steady decrease in intensity, and (iii) valence band characterization of CNTs using X-radiation is reported. Initial analysis of the CNT forest by XPS shows that it is 100 at.% carbon. After one year, only ca. 0.25 at.% oxygen is observed. The information obtained from the combination of the different analytical tools provides a more complete understanding of our materials than a single technique, which is analogous to the story of 'The Blind Men and the Elephant'. The raw XPS and ToF-SIMS spectra from this study will be submitted to Surface Science Spectra for archiving.

show abstract

Section: Discussionmentioning

confidence: 53%

Multi‐instrument characterization of the surfaces and materials in microfabricated, carbon nanotube‐templated thin layer chromatography plates. An analogy to ‘The Blind Men and the Elephant’

Jensen

Kanyal

Madaan

et al. 2013

Surface & Interface Analysis

View full text Add to dashboard Cite

show abstract

“…In this case, the distinctions between models using the continuous potential approximation and discrete models describing the dynamics of all atoms are the most important, and the second approach, which is chosen as the main one in this paper, is more realistic. The chosen approach also takes into account the thermal motion of atoms, the possibility of defect formation, and, unlike the continuous potential model, the total energy of the channeled particle is not conserved even if deceleration in the electron gas is not taken into account [15,16]. It should be mentioned that, for ions moving with low energies (1 keV or less) at channeling angles that are close to critical, fast neu STEPANOV tralization occurs after several collisions with the wall because of charge exchange phenomena.…”

Section: Theoretical Analysismentioning

confidence: 99%

Influence of elastic perturbations of the wall of a carbon nanotube upon the channeling of slow atomic particles

Степанов

2015

J. Synch. Investig.

Self Cite

View full text Add to dashboard Cite

The influence of elastic perturbations of the wall of a carbon nanotube upon the channeling of slow atomic particles moving at angles close to the critical angles in it is studied using the molecular dynamics method. It is shown that, if the longitudinal component of the channeled particle momentum coincides, within a certain range, with the velocity of elastic perturbation propagation along the carbon nanotube axis, then the elastic perturbation can affect losses in the channeled particle energy. For the motion of an atomic particle in an unperturbed tube in a certain range of channeling angles, the energy losses can be 1.5-3 times greater than those under the same initial conditions as in a tube with a propagating elastic perturbation. The indicated peculiarity can lead to longer paths than those expected in models that do not take elastic pertur bations of the nanotube wall into account.

show abstract

Channeling and energy losses of 10MeV protons in straight chiral carbon nanotube bundles

Karabarbounis

Sarros

Trikalinos

2013

Nuclear Instruments and Methods in Physics Research Section B:

View full text Add to dashboard Cite

The effect of atomic dynamics on the energy loss of ions channeled in carbon nanotubes

Cited by 8 publications

References 4 publications

Multi‐instrument characterization of the surfaces and materials in microfabricated, carbon nanotube‐templated thin layer chromatography plates. An analogy to ‘The Blind Men and the Elephant’

Multi‐instrument characterization of the surfaces and materials in microfabricated, carbon nanotube‐templated thin layer chromatography plates. An analogy to ‘The Blind Men and the Elephant’

Influence of elastic perturbations of the wall of a carbon nanotube upon the channeling of slow atomic particles

Channeling and energy losses of 10MeV protons in straight chiral carbon nanotube bundles

Contact Info

Product

Resources

About