The Effect of Applied Voltage and Operating Pressure on Emitted X-Ray from Nitrogen (N2) Gas in APF Plasma Focus Device

Roomi, A.; Saion, Elias; Habibi, M.; Amrollahi, R.; Baghdadi, Reza; Etaati, G. R.; Mahmood, W.; Iqbal, Muhammad

doi:10.1007/s10894-011-9395-2

Cited by 14 publications

(4 citation statements)

References 24 publications

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“…SXRs from PF devices operated with Ne and N gases are characterized for different discharge voltages and gas pressures [12][13][14]. After determining optimum gas pressure and discharge voltage for high x-ray yield, it was concluded that x-ray yield strongly depends on gas pressure and discharge voltage in PF devices.…”

Section: Introductionmentioning

confidence: 99%

Spherical plasma focus operated with nitrogen and neon gases for soft x-rays (bremsstrahlung radiation, line radiation, and radiative recombination)

2021

Plasma Phys. Control. Fusion

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X-ray emissions (bremsstrahlung radiation, line radiation, and radiative recombination) from spherical plasma focus (SPF) device are investigated with the developed spherical MHD model for nitrogen (N) and neon (Ne) gases with respect to gas pressure, which is varied from 0.1 Torr to 7 Torr. Ion density, plasma velocity, pinch temperature, and peak current are also calculated for N and Ne gases. The total capacitance, external inductance, charging voltage, and stored energy as the operational conditions of the SPF device in this study are 432 µF, 36 nH, 25 kV, and 135 kJ. The maximum current is achieved at 7 Torr for both N (1561 kA) and Ne (1525 kA). It is found that there is an optimum pressure point for both x-rays (bremsstrahlung radiation, line radiation, and radiative recombination) and the used gases (N and Ne), separately. While the optimum pressure of bremsstrahlung radiation for N and Ne gases are 0.9 Torr and 1 Torr, respectively, these optimum pressures of radiative recombination and line radiation are 1 Torr for N gas and 1.1 Torr for Ne gas, respectively. It is also found that line radiation constitutes the big portion of the soft x-ray (SXR) emissions from SPF device. Line radiations of N at 1 Torr and Ne at 1.1 Torr are 911 J (91% of total N SXRs) and 3036.5 J (93.1% of total Ne SXRs), respectively, which shows that SPF device can be considered as a good SXR source. Ion densities and peak currents at 7 Torr are calculated as 21.88 × 1023 m−3 with 1561 kA peak current for N gas and 15.98 × 1023 m−3 with 1525 kA peak current for Ne gas.

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Section: Introductionmentioning

confidence: 99%

Spherical plasma focus operated with nitrogen and neon gases for soft x-rays (bremsstrahlung radiation, line radiation, and radiative recombination)

2021

Plasma Phys. Control. Fusion

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“…Roomi et al investigated effect of the voltage and operating pressure on the soft and hard x-ray production using nitrogen as a working gas [10]. It is found that soft x-ray and hard x-ray emissions from the plasma focus device have different optimum conditions.…”

Section: Introductionmentioning

confidence: 99%

Basinç Ve Voltajin Küresel Plazma Odak Ci̇hazi Di̇nami̇ Üzeri̇ne Etki̇si̇

2020

Eskişehir Teknik Üniversitesi Bilim Ve Teknoloji Dergisi B - Teorik Bilimler

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A spherical plasma focus device with two concentric electrodes is simulated using deuterium and tritium mixture (50:50) as a working gas. The developed model is used to study the effect of gas pressure and charging voltage on dynamics of current sheath in spherical plasma focus. While charging voltage is varied from 15 kV to 30 kV to see the effect of voltage, gas pressure is increased from 1 Torr to 20 Torr for gas pressure study. In this work, it is found that there is a strong correlation between current sheath dynamics and investigated parameters which are gas pressure and charging voltage.

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“…Since soft x-ray and hard x-ray emission have different production mechanisms in the PF devices, they also have different optimum operating conditions. Therefore, PF devices can be optimized for either soft x-ray emission or hard x-ray emission even though increasing charging voltage increases both soft x-ray and hard x-ray emissions, which shows that x-ray production has a strong correlation with charging voltage in the cylindrical plasma focus devices [10].…”

Section: Introductionmentioning

confidence: 99%

Küresel Plazma Odak Cihazında Uygulanan Farklı Voltajlar İle Nötron ve İyon Üretimi

Ay¹

2020

DÜMF Mühendislik Dergisi

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In this work, the applied voltage effect on neutron yield and ion production are studied by varying the charging voltage between 15 kV and 30 kV with 1 kV increment to investigate neutron yield, radiation emissions and ion properties using the developed MHD model. While Joule heating, radiative recombination, bremsstrahlung and line radiation are calculated as radiation terms, beam-ion speed, energy and density are calculated as ion properties. The dominant neutron production mechanism is beam-target which results from the accelerated energetic ions under the diode voltage which is calculated along with neutron yield. In this study, while maximum neutron yield is 2.63 10 13 for 30 kV charging voltage, beamion energy and speed reach 61 keV and 240 cm/µs, respectively.

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The Effect of Applied Voltage and Operating Pressure on Emitted X-Ray from Nitrogen (N2) Gas in APF Plasma Focus Device

Cited by 14 publications

References 24 publications

Spherical plasma focus operated with nitrogen and neon gases for soft x-rays (bremsstrahlung radiation, line radiation, and radiative recombination)

Spherical plasma focus operated with nitrogen and neon gases for soft x-rays (bremsstrahlung radiation, line radiation, and radiative recombination)

Basinç Ve Voltajin Küresel Plazma Odak Ci̇hazi Di̇nami̇ Üzeri̇ne Etki̇si̇

Küresel Plazma Odak Cihazında Uygulanan Farklı Voltajlar İle Nötron ve İyon Üretimi

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