2009
DOI: 10.1016/j.orgel.2009.08.016
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The effect of Al electrodes on the nanostructure of poly(3-hexylthiophene): Fullerene solar cell blends during thermal annealing

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Cited by 52 publications
(24 citation statements)
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“…As the annealing temperature increasing from 100°C to 150°C, the results showed a degrading in device performance and stability. We find that the optimum annealing temperature is below 150°C as reported by Ryu et al 2009 [4] and Kim et al 2009 [5], which mention about the aggregation of PCBM and increasing of P3HT crystal size when annealing temperature reached 150°C will degrading the device stability and performance [4][5]. The JV characteristic showed the degrading the device stability and performance of the organic solar cell device with annealing temperature of 150°C.…”
Section: Experiments Methodssupporting
confidence: 63%
“…As the annealing temperature increasing from 100°C to 150°C, the results showed a degrading in device performance and stability. We find that the optimum annealing temperature is below 150°C as reported by Ryu et al 2009 [4] and Kim et al 2009 [5], which mention about the aggregation of PCBM and increasing of P3HT crystal size when annealing temperature reached 150°C will degrading the device stability and performance [4][5]. The JV characteristic showed the degrading the device stability and performance of the organic solar cell device with annealing temperature of 150°C.…”
Section: Experiments Methodssupporting
confidence: 63%
“…However, the corresponding open-circuit voltage ( V oc ) decreases from 0.70 to 0.65 V. All photovoltaic properties of three samples are provided in Table 1 . A higher crystallization, better ordering of the intra-chain configuration, and an improvement in the vertical phase segregation of the thermally-treated sample improve the overall device efficiency 5 11 12 13 14 15 16 17 18 19 20 .…”
Section: Resultsmentioning
confidence: 99%
“…In this method a spin-coated film contains the solvent for a given time, and the spin-coated wet film is then allowed to dry slowly in a covered glass petri dish. Recently, experimental studies [including atomic force microscopy (AFM) 11 12 , ultraviolet and X-ray photoemission spectroscopy (UPS, XPS) 13 14 , transmission electron microscopy (TEM) 12 15 , grazing-incidence wide-angle X-ray scattering (GIWAXS) 16 17 , and small angle neutron scattering 18 ] showed that both thermal annealing and solvent vapor treatment processes improve the morphology and vertical phase separation of OPV, which consequently leads to a dramatic improvement in the performance of a P3HT:PC 61 BM bulk heterojunction system. Y. T. Wang et al .…”
mentioning
confidence: 99%
“…Out of plane cut is very important since it provides the (100), (200) and (300) peak information, that typically comes from any edge-on orientation of P3HT. 39,40 Position and intensity of (010) peak can be derived from the inplane line cut. The (010) peaks indicates π-π stacking for face-on orientation of P3HT.…”
Section: Methodsmentioning
confidence: 99%