The direct study by electron microscopy of crystal lattices and their imperfections

Menter, J. W.

doi:10.1080/14786430600779532

Cited by 15 publications

(14 citation statements)

References 19 publications

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“…Figure 8 (a), shows a bright field TEM image of the specimen. A dark dot is observed, with a bright region on one side of the dot and a dark region on the other side, which is similar to TEM images of edge dislocations 25,26 . In the subsequent APT reconstruction of the same specimen presented in Figure 8 (b) and (c), two spherical Ni clusters with a diameter ~10 nm are observed decorating the defect.…”

Section: Isolated Dislocation Characterisationsupporting

confidence: 77%

Specimen preparation methods for elemental characterisation of grain boundaries and isolated dislocations in multicrystalline silicon using atom probe tomography

Lotharukpong

Tweddle

Martin

et al. 2017

Materials Characterization

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Multicrystalline silicon (mc-Si) is a cost effective feedstock for solar photovoltaic devices but is limited by the presence of defects and impurities. Imaging impurities segregated to nanometre-scale dislocations and grain boundaries is a challenge that few materials characterisation techniques can achieve. Atom Probe Tomography (APT) is a 3-dimensional time-of-flight microscopy technique that can image the distribution of elements at the atomic scale, however one of the most challenging factors when using APT is the complexity of specimen preparation for specific regions of interest. Atom probe specimen preparation methods have been developed in a dual FIB/SEM system that enable a specific extended defect such as an isolated dislocation or a section of a grain boundary to be selected for APT analysis. The methods were used to fabricate APT specimens from an isolated dislocation and a grain boundary in mc-Si samples. Complementary TEM images confirm the presence of the defects in both specimens, whilst APT analyses also reveal segregation of impurities to the defects.

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Section: Isolated Dislocation Characterisationsupporting

confidence: 77%

Specimen preparation methods for elemental characterisation of grain boundaries and isolated dislocations in multicrystalline silicon using atom probe tomography

Lotharukpong

Tweddle

Martin

et al. 2017

Materials Characterization

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“…(This differs from the diffraction contrast technique, in which the image is formed by one bright-field or dark-field beam.) J. W. (later Sir James) Menter FRS was the first to show (see Menter 1956) that by using this technique, images of fringes could be produced in a crystal of platinum phthalocyanine that had the same spacing as the lattice planes. The lattice spacing in this structure (1.2 nm) was large enough to be resolved with the microscopes available at that time.…”

Section: The First Oxford Period 1966-74mentioning

confidence: 99%

David John Hugh Cockayne. 19 March 1942 — 22 December 2010

Hirsch

2015

Biogr. Mems Fell. R. Soc.

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David Cockayne had a wide-ranging and lasting impact on electron microscopy in materials science. He had dual UK and Australian nationality, and his professional career was divided between the two countries. His research was exceptional. His most important scientific contribution was the development (with I. L. F. Ray and M. J. Whelan in Oxford) of the dark-field ‘weak-beam’ technique of transmission electron microscopy, which improved by an order of magnitude (to 1.5 nm) the resolution at which complex crystal lattice defect geometries could be studied. The technique had a significant impact on advancing our understanding of the structure and properties of lattice defects in many materials, and became established as a routine tool in laboratories all over the world; it is still widely used today. With D. R. McKenzie in Sydney he developed a powerful high-precision electron diffraction technique within an electron microscope to study small volumes of amorphous material, orders of magnitude smaller than is possible with X-rays or neutrons, giving nearest-neighbour distances accurate to 0.001 nm. As Director of the University of Sydney Electron Microscope Unit from 1974 to 1999, he led the development of the Unit to provide a first-class centralized service of electron microscopy for the university as a whole. This stimulated other Australian universities to follow his example.

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“…He resolved the (201) planes of platinum phthalocyanine-a distance of 12.0 Å apart-and succeeded in demonstrating the presence of dislocations (figure 2). 1 This microstructural coup was effected in the butler's pantry in the Old Hall at Hinxton, where the extra thickness of the walls, originally intended to protect the family silver, was found to produce the lowest ambient magnetic field on the site and hence the best location for installing the electron microscope.…”

Section: The 'Ivory Tower' Phasementioning

confidence: 99%

Tube Investments Group Research Laboratory, Hinxton Hall (1954–88)

Melford¹,

Duncumb²,

Stowell³

et al. 2010

Notes Rec. R. Soc.

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It was probably Sir Ben Lockspeiser (formerly Director General of Scientific Research in the wartime Ministry of Aircraft Production) who played the most influential part in the decision to set up the Tube Investments Group Research Laboratory (TIRL) in the first place. Sir Ivan Stedeford was then Chairman of the Tube Investments Group (TI) of more than 50 manufacturing companies, which produced a highly diverse range of products including steel, steel tube, bicycles, machine tools, gas cookers, vehicle exhaust systems, rings for jet engines, and mechanical seals, among much else. Sir Ben, then a member of the TI board, persuaded him that basic research, which had contributed so much to winning World War II, would be good for industry and aid its postwar resurgence.The Group was expanding rapidly and had set up, at Walsall Airport, the TI Technology Centre, which housed computer and operational research facilities. The core of the Group was the Steel Tube Division, which consisted of several companies, mainly in the Birmingham area, manufacturing steel tubes by a variety of processes. Over and above the essential production control facilities possessed by individual companies, the Division had set up the Department of Development and Research, which then became part of the Technology Centre. It addressed short-term customer complaints and production problems and conducted such research as might uncover the causes of perennial examples of both.Set against this background, the commercial rationale for buying an old country house and transforming it into a basic research laboratory may not have been obvious at the time to some of the senior management. Nevertheless, Sir Ben Lockspeiser was not alone in urging the need for change. This was the era in which no blue-chip corporation was complete without its 'ivory tower': AEI (Associated Electrical Industries) at Aldermaston Court, Pilkingtons in St Helens, ICI (Imperial Chemical Industries) and BP (British Petroleum) all had, or were setting up, major laboratories for conducting basic research.Close contact with a major university was deemed essential, as was remoteness from any of the operating companies that might be tempted to overload the Laboratory with production problems. Hinxton Hall, nine miles outside Cambridge, had been on the market for some time and fitted these criteria admirably. TI bought it in 1953 together with the plans of

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The direct study by electron microscopy of crystal lattices and their imperfections

Cited by 15 publications

References 19 publications

Specimen preparation methods for elemental characterisation of grain boundaries and isolated dislocations in multicrystalline silicon using atom probe tomography

Specimen preparation methods for elemental characterisation of grain boundaries and isolated dislocations in multicrystalline silicon using atom probe tomography

David John Hugh Cockayne. 19 March 1942 — 22 December 2010

Tube Investments Group Research Laboratory, Hinxton Hall (1954–88)

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